{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T16:25:39Z","timestamp":1783009539793,"version":"3.54.5"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51905005"],"award-info":[{"award-number":["51905005"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51605130"],"award-info":[{"award-number":["51605130"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61603360"],"award-info":[{"award-number":["61603360"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003995","name":"Natural Science Foundation of Anhui Province","doi-asserted-by":"publisher","award":["2008085QF318"],"award-info":[{"award-number":["2008085QF318"]}],"id":[{"id":"10.13039\/501100003995","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Open Fund of Key Laboratory of Icing and Anti-\/De-Icing","award":["IADL20190303"],"award-info":[{"award-number":["IADL20190303"]}]},{"DOI":"10.13039\/501100003819","name":"Natural Science Foundation of Hubei Province","doi-asserted-by":"publisher","award":["2018CFB656"],"award-info":[{"award-number":["2018CFB656"]}],"id":[{"id":"10.13039\/501100003819","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3032185","type":"journal-article","created":{"date-parts":[[2020,10,21]],"date-time":"2020-10-21T17:23:05Z","timestamp":1603300985000},"page":"1-9","source":"Crossref","is-referenced-by-count":34,"title":["Two-Digit Phase-Coding Strategy for Fringe Projection Profilometry"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3403-7675","authenticated-orcid":false,"given":"Xiangcheng","family":"Chen","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9383-9635","authenticated-orcid":false,"given":"Jun","family":"Wu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9066-2846","authenticated-orcid":false,"given":"Ruimei","family":"Fan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9439-2970","authenticated-orcid":false,"given":"Qing","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1049-7471","authenticated-orcid":false,"given":"Yongxin","family":"Xiao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4282-9821","authenticated-orcid":false,"given":"Yuwei","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0165-0561","authenticated-orcid":false,"given":"Yajun","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.03.003"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2010.2076362"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/1.3591950"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.05.008"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/OL.36.002518"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.02.012"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.020381"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2976421"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/AO.56.003660"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.04.009"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106012"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2012952"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2017.05.024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.04.019"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"3305","DOI":"10.1109\/TIM.2009.2022382","article-title":"Inverse function analysis method for fringe pattern profilometry","volume":"58","author":"hu","year":"2009","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.01.011"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2012.03.008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2481707"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/AOP.3.000128"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.04.022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2009.03.012"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/OL.37.002067"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.028613"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1364\/OE.20.024139"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.105982"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/AO.58.007359"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.03.018"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2019.105781"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09229382.pdf?arnumber=9229382","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:24Z","timestamp":1652194284000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9229382\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3032185","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}