{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:53:17Z","timestamp":1762253597310,"version":"3.37.3"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875228"],"award-info":[{"award-number":["51875228"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Project of the National Defense Science and Technology Innovation Special Zone","award":["193-A14-202-01-23"],"award-info":[{"award-number":["193-A14-202-01-23"]}]},{"name":"Program for Guangdong Introducing Innovative and Entrepreneurial Teams","award":["2017ZT07G331"],"award-info":[{"award-number":["2017ZT07G331"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3032190","type":"journal-article","created":{"date-parts":[[2020,10,21]],"date-time":"2020-10-21T17:23:05Z","timestamp":1603300985000},"page":"1-15","source":"Crossref","is-referenced-by-count":17,"title":["Autolabeling-Enhanced Active Learning for Cost-Efficient Surface Defect Visual Classification"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5430-5630","authenticated-orcid":false,"given":"Hua","family":"Yang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8999-2680","authenticated-orcid":false,"given":"Kaiyou","family":"Song","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8358-4045","authenticated-orcid":false,"given":"Fangqin","family":"Mao","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5766-2337","authenticated-orcid":false,"given":"Zhouping","family":"Yin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICEIEC49280.2020.9152261"},{"key":"ref38","first-page":"1","article-title":"Siamese neural networks for one-shot image recognition","volume":"2","author":"koch","year":"2015","journal-title":"Proc ICML Deep Learn Workshop"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-71496-5_24"},{"key":"ref32","first-page":"59","article-title":"Incorporating diversity in active learning with support vector machines","author":"brinker","year":"2003","journal-title":"Proc 20th Int Conf Mach Learn (ICML)"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2016.2589879"},{"key":"ref30","first-page":"150","article-title":"Committee-based sampling for training probabilistic classifiers","author":"dagan","year":"1995","journal-title":"Machine Learning Proceedings"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2017.2747600"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.309"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.170"},{"key":"ref34","article-title":"Robust active learning for electrocardiographic signal classification","author":"chen","year":"2018","journal-title":"arXiv 1811 08919"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2651372"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/584091.584093"},{"key":"ref29","first-page":"1","article-title":"Query learning strategies using boosting and bagging","volume":"1","author":"mamitsuka","year":"1998","journal-title":"Proc 15th Int Conf Mach Learn"},{"key":"ref2","article-title":"Automatic defect detection and classification technique from image: A special case using ceramic tiles","author":"rahaman","year":"2009","journal-title":"arXiv 0906 3770"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2012.6252468"},{"key":"ref20","article-title":"Active learning literature survey","volume":"52","author":"settles","year":"2010"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-012-0507-8"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1061\/9780784480823.036"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.21236\/ADA440382"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-2099-5_1"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2008.4563068"},{"key":"ref25","first-page":"309","article-title":"Active hidden Markov models for information extraction","author":"scheffer","year":"2001","journal-title":"Proc Int Symp Intell Data Anal"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.308"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.243"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.282"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2018.2823709"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2777499"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-009-0285-2"},{"article-title":"Multi-class support vector machines","year":"1998","author":"weston","key":"ref13"},{"key":"ref14","first-page":"5484","article-title":"External defect classification of citrus fruit images using linear discriminant analysis clustering and ann classifiers","volume":"4","author":"vijayarekha","year":"2012","journal-title":"Res J Appl Sci Eng Technol"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"237","DOI":"10.1007\/978-0-387-78189-1_8","article-title":"Linear discriminant analysis","author":"izenman","year":"2013","journal-title":"Modern Multivariate Statistical Techniques"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2010.1018"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/nature14539"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2016.04.072"},{"key":"ref19","first-page":"668","article-title":"Convolutional neural networks for steel surface defect detection from photometric stereo images","author":"soukup","year":"2014","journal-title":"Proc Int Symp Vis Comput"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"1210","DOI":"10.1016\/j.procs.2014.08.218","article-title":"Defect classification of electronic circuit board using SVM based on random sampling","volume":"35","author":"hagi","year":"2014","journal-title":"Procedia Comput Sci"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/12.486007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2015.2430453"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2648856"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2016.2532899"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2016.2569558"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2795178"},{"article-title":"The kth-tips database","year":"2004","author":"fritz","key":"ref46"},{"key":"ref45","article-title":"The kth-tips2 database","author":"mallikarjuna","year":"2006","journal-title":"Computational Vision and Active Perception Laboratory (CVAP)"},{"key":"ref48","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"arXiv 1409 1556"},{"article-title":"Keras","year":"2015","author":"chollet","key":"ref47"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.240"},{"key":"ref41","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2014","journal-title":"arXiv 1412 6980"},{"key":"ref44","article-title":"Deep learning is robust to massive label noise","author":"rolnick","year":"2017","journal-title":"arXiv 1705 10694"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TETCI.2017.2771298"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09229521.pdf?arnumber=9229521","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:31Z","timestamp":1652194291000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9229521\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":52,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3032190","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}