{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:23Z","timestamp":1740132563524,"version":"3.37.3"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3035853","type":"journal-article","created":{"date-parts":[[2020,12,4]],"date-time":"2020-12-04T17:11:34Z","timestamp":1607101894000},"page":"1-1","source":"Crossref","is-referenced-by-count":1,"title":["Editor-in-Chief\u2019s Opening Message"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3973-4445","authenticated-orcid":false,"given":"Shervin","family":"Shirmohammadi","sequence":"first","affiliation":[{"name":"University of Ottawa, Ottawa, ON, Canada"}]}],"member":"263","container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09281390.pdf?arnumber=9281390","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:35:29Z","timestamp":1641987329000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9281390\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3035853","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}