{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T10:51:47Z","timestamp":1742381507796,"version":"3.37.3"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3042304","type":"journal-article","created":{"date-parts":[[2020,12,3]],"date-time":"2020-12-03T20:33:49Z","timestamp":1607027629000},"page":"1-8","source":"Crossref","is-referenced-by-count":2,"title":["Low-Complexity 1-bit Detection of Parametric Signals for IoT Sensing Applications"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7953-4272","authenticated-orcid":false,"given":"Alessio","family":"De Angelis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2557-349X","authenticated-orcid":false,"given":"Guido","family":"De Angelis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0540-1287","authenticated-orcid":false,"given":"Paolo","family":"Carbone","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908125"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2016.2628347"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2897929"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CAMSAP.2017.8313172"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2618978"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2863999"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2902023"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/7068349"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9128746"},{"journal-title":"Fundamentals statistical signal processing detection theory","year":"2008","author":"kay","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2016.7869554"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RADAR.2018.8378600"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"2527","DOI":"10.3390\/s17112527","article-title":"Comparison of measurement models for 3D magnetic localization and tracking","volume":"17","author":"de angelis","year":"2017","journal-title":"SENSORS"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2017.8335529"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2018.8573586"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SysEng.2015.7302503"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2018.8644816"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2018.8573590"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2019.2892196"},{"journal-title":"Categorical Data Analysis","year":"2013","author":"agresti","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2627298"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-8176-4956-2"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1117\/12.918888"},{"journal-title":"Probability and Measure","year":"1995","author":"billingsley","key":"ref23"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09279280.pdf?arnumber=9279280","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:17Z","timestamp":1652194277000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9279280\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3042304","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}