{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,5]],"date-time":"2025-12-05T12:20:29Z","timestamp":1764937229443,"version":"3.37.3"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007761","name":"NIST Center for Nanoscale Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007761","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3043943","type":"journal-article","created":{"date-parts":[[2020,12,10]],"date-time":"2020-12-10T20:34:28Z","timestamp":1607632468000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Low-Frequency Characteristics of Silicon-Based High-Current Multijunction Thermal Current Converters Fabricated by Wet Chemical Etching"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6816-8158","authenticated-orcid":false,"given":"Yasutaka","family":"Amagai","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6375-7508","authenticated-orcid":false,"given":"Stefan","family":"Cular","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0909-6016","authenticated-orcid":false,"given":"Joseph A.","family":"Hagmann","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8943-3325","authenticated-orcid":false,"given":"Thomas E.","family":"Lipe","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3857-7940","authenticated-orcid":false,"given":"Nobu-Hisa","family":"Kaneko","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TIM.1978.4314677"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/19.571854"},{"year":"1999","author":"laiz","article-title":"Low frequency behavior of thin-film multijunction thermal converters","key":"ref12"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TIM.2015.2389371"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TIM.1987.6312694"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/19.982933"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TIM.2003.810037"},{"key":"ref17","first-page":"358","article-title":"A method to determine the low frequency behavior of thermal converters","author":"ryder","year":"2002","journal-title":"Conf Precision Electromagn Meas Dig"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/19.571863"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.6028\/jres.102.007"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/CPEM.2002.1034873"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TIM.2016.2613405"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/CPEM49742.2020.9191874"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TIM.2004.843354"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIM.1976.6312279"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TIM.1987.6312691"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1088\/0960-1317\/18\/2\/025029"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/19\/9259274\/9290099-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09290099.pdf?arnumber=9290099","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:20Z","timestamp":1652194280000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9290099\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3043943","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}