{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T06:07:42Z","timestamp":1744870062085,"version":"3.37.3"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/Crown.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3045797","type":"journal-article","created":{"date-parts":[[2020,12,25]],"date-time":"2020-12-25T20:47:35Z","timestamp":1608929255000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Calibration of Electrical Instruments Under Nonsinusoidal Conditions at NRC Canada"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7546-9207","authenticated-orcid":false,"given":"Branislav","family":"Djokic","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8144-5460","authenticated-orcid":false,"given":"Harold","family":"Parks","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1965.4313475"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501080"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2002.1034818"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1990.1032973"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2912589"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501240"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843418"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1049\/PBEL004E"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.1986.4307894"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2011097"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.918120"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1983.4315028"},{"key":"ref11","first-page":"267","article-title":"A comparison between NIM China and NRC Canada systems to evaluate performance characteristics of harmonic power analyzers","author":"wang","year":"2010","journal-title":"CPEM Dig"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.746616"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843313"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2022446"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108618"},{"key":"ref16","first-page":"1","article-title":"A NIST testbed for examining the accuracy of smart meters under high harmonic waveform loads","author":"steiner","year":"2018","journal-title":"CPEM Dig"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2880056"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.09.003"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2877828"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544087"},{"year":"2002","key":"ref4"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540741"},{"year":"2015","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/61.193863"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2784998"},{"year":"2017","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/61.400894"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/61.156980"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.2010.5439063"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.571865"},{"year":"0","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM49742.2020.9191765"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1990.1032968"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/19.192312"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/19.7476"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1985.4315425"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2002.1034882"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/19.769611"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09309169.pdf?arnumber=9309169","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:13Z","timestamp":1652194273000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9309169\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3045797","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}