{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T14:49:27Z","timestamp":1777992567818,"version":"3.51.4"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"publisher","award":["2019-JCJQ-ZD-133-00"],"award-info":[{"award-number":["2019-JCJQ-ZD-133-00"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Open Project of Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology","award":["FM-201901"],"award-info":[{"award-number":["FM-201901"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/tim.2020.3045841","type":"journal-article","created":{"date-parts":[[2020,12,21]],"date-time":"2020-12-21T21:41:56Z","timestamp":1608586916000},"page":"1-1","source":"Crossref","is-referenced-by-count":97,"title":["Second-Order Synchroextracting Transform with Application to Fault Diagnosis"],"prefix":"10.1109","author":[{"given":"Wenjie","family":"Bao","sequence":"first","affiliation":[]},{"given":"Fucai","family":"Li","sequence":"additional","affiliation":[]},{"given":"Xiaotong","family":"Tu","sequence":"additional","affiliation":[]},{"given":"Yue","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Zhoujie","family":"He","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2686355"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2016.11.001"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2013.2265316"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/78.382394"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1978.1163047"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/19.769633"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2017.7952906"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2014.6853609"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2010.08.002"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2613359"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2010.12.001"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2960595"},{"key":"ref11","first-page":"395","article-title":"Application of the EEMD method to multiple faults diagnosis of gearbox","author":"lin","year":"2010","journal-title":"Proc 2nd Int Conf Adv Comput Control"},{"key":"ref12","first-page":"383","article-title":"Gearbox fault diagnosis under different operating conditions based on time synchronous average and ensemble empirical mode decomposition","author":"guan","year":"2009","journal-title":"Proc ICCAS-SICE"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2007.10.003"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2007.04.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2008.01.020"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1142\/S179353690900028X"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2016.03.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.08.039"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1177\/0954406216642478"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984983"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.887042"},{"key":"ref27","first-page":"1","article-title":"Study on signal recognition and diagnosis for spacecraft based on deep learning method","author":"li","year":"2015","journal-title":"Proc Prognostics Syst Health Manage Conf (PHM)"},{"key":"ref3","first-page":"6281","article-title":"Ensemble empirical mode decomposition","volume":"55","author":"kuo","year":"2011","journal-title":"Source"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTMA.2009.429"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2730982"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2011.07.025"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CECNET.2011.5769072"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2010.5413421"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2978570"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/FSKD.2008.64"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2197072"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2019.06.007"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SDPC.2018.8664850"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.dib.2018.11.019"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.01.016"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2016.01.024"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.10.007"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2017.2714578"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2006.08.005"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2696503"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2006.12.007"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/S0165-1684(00)00236-X"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.10.025"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.1994.390031"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/11\/115002"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/4407674\/09301263.pdf?arnumber=9301263","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T12:14:38Z","timestamp":1643199278000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9301263\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3045841","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}