{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T15:41:54Z","timestamp":1775144514490,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51877183"],"award-info":[{"award-number":["51877183"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Nature Science Foundation of China","doi-asserted-by":"publisher","award":["U1834203"],"award-info":[{"award-number":["U1834203"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100012542","name":"Sichuan Science and Technology Program","doi-asserted-by":"publisher","award":["2020JDTD0009"],"award-info":[{"award-number":["2020JDTD0009"]}],"id":[{"id":"10.13039\/100012542","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3047194","type":"journal-article","created":{"date-parts":[[2020,12,24]],"date-time":"2020-12-24T20:38:39Z","timestamp":1608842319000},"page":"1-10","source":"Crossref","is-referenced-by-count":19,"title":["A High-Precision Diagnosis Method for Damp Status of OIP Bushing"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6070-0020","authenticated-orcid":false,"given":"Lijun","family":"Zhou","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8530-887X","authenticated-orcid":false,"given":"Wei","family":"Liao","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9402-2769","authenticated-orcid":false,"given":"Dongyang","family":"Wang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1224-2440","authenticated-orcid":false,"given":"Dong","family":"Wang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1951-7133","authenticated-orcid":false,"given":"Guinan","family":"Zhang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0973-708X","authenticated-orcid":false,"given":"Yi","family":"Cui","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3826-3052","authenticated-orcid":false,"given":"Junyi","family":"Cai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2013.6410539"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2937074"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2933342"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2902003"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2906086"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CCDC.2019.8832683"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-016-1222-1"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1080\/10618600.2000.10474879"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3934\/mbe.2019420"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2012.0101"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2017.12.027"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/en81212429"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2016.0859"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.1591"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2959500"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2895482"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2952217"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.0194"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/en11061496"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2976278"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2447518"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.006088"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2014.004478"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2652359"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2017.7906158"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"933","DOI":"10.1109\/TNNLS.2014.2329097","article-title":"Evolutionary fuzzy ARTMAP neural networks for classification of semiconductor defects","volume":"26","author":"chiang tan","year":"2015","journal-title":"IEEE Trans Neural Netw Learn Syst"},{"key":"ref5","year":"1997","journal-title":"Insulating Liquids—Oil-Impregnated Paper and Pressboard—Determination of Water by Automatic Coulometric Karl Fischer Titration"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2018.08.006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2002.1019901"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-017-0532-4"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.2018.8571325"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijimpeng.2019.03.007"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2017.0595"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.5370\/JEET.2017.12.2.830"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/polym12061219"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2770166"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.07.016"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2676245"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2902274"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09306924.pdf?arnumber=9306924","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:52:22Z","timestamp":1652194342000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9306924\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3047194","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}