{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T20:51:44Z","timestamp":1757451104860,"version":"3.37.3"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100014132","name":"EMPIR","doi-asserted-by":"publisher","award":["17NRM02"],"award-info":[{"award-number":["17NRM02"]}],"id":[{"id":"10.13039\/100014132","id-type":"DOI","asserted-by":"publisher"}]},{"name":"European Unions Horizon 2020 research and innovation programme"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3048517","type":"journal-article","created":{"date-parts":[[2021,1,9]],"date-time":"2021-01-09T10:10:24Z","timestamp":1610187024000},"page":"1-1","source":"Crossref","is-referenced-by-count":1,"title":["Validating an Isolator to eliminate grounding issues for high-resolution digitizer measurements"],"prefix":"10.1109","author":[{"given":"P.N.","family":"Davis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.S.","family":"Wright","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TIM.2011.2117330"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TIM.2019.2941260"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/CPEM49742.2020.9191920"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/CPEM.2008.4574892"},{"year":"2019","journal-title":"P2 Relay V23079 Data Sheet","key":"ref11"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/CPEM.2010.5544087"},{"year":"1979","author":"milman","journal-title":"Microelectronics Digital and Analog Circuits and Systems","key":"ref12"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/NEWCAS49341.2020.9159790"},{"year":"2020","journal-title":"IS0124 Datasheet","key":"ref7"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/19.377871"},{"year":"2019","journal-title":"AD215 Data Sheet","key":"ref9"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/EMCEurope.2019.8872130"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/4407674\/09316991.pdf?arnumber=9316991","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T11:03:46Z","timestamp":1643281426000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9316991\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3048517","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}