{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T16:02:25Z","timestamp":1775145745859,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004826","name":"Beijing Natural Science Foundation","doi-asserted-by":"publisher","award":["3202031"],"award-info":[{"award-number":["3202031"]}],"id":[{"id":"10.13039\/501100004826","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51737005"],"award-info":[{"award-number":["51737005"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51929701"],"award-info":[{"award-number":["51929701"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2021.3055288","type":"journal-article","created":{"date-parts":[[2021,1,28]],"date-time":"2021-01-28T20:29:22Z","timestamp":1611865762000},"page":"1-9","source":"Crossref","is-referenced-by-count":30,"title":["Research on Charge Accumulation Characteristics by PEA Method and <i>Q<\/i>(<i>t<\/i>) Method"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8956-4413","authenticated-orcid":false,"given":"Hanwen","family":"Ren","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3629-5966","authenticated-orcid":false,"given":"Tatsuo","family":"Takada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3199-1789","authenticated-orcid":false,"given":"Hiroaki","family":"Uehara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5431-457X","authenticated-orcid":false,"given":"Shinya","family":"Iwata","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5049-3980","authenticated-orcid":false,"given":"Qingmin","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-nde.2018.0009"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2015.00015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEI.1987.298914"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2927669"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICPADM.2018.8401275"},{"key":"ref15","first-page":"1","article-title":"A problem on PEA measurement for shallow trapped space charge in dielectric material","author":"takada","year":"2019","journal-title":"Proc Papers Tech Meeting"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2018.8544833"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1541\/ieejfms1972.92.537"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2892739"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IWIPP.2019.8799087"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICPADM.2018.8401118"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006132"},{"key":"ref27","year":"0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/hve.2018.5095"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006525"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2018.8544909"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.997825"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8500879"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2015.7182071"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5452"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.7736878"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.008528"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.006738"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2019.8804333"},{"key":"ref21","first-page":"1393","article-title":"Charge dynamics and high-field conduction analysis of XLPE insulation based on the novel current integrated charge technique","volume":"43","author":"nie","year":"2017","journal-title":"High Voltage Eng"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.008474"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMPE.2017.7982074"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CMD.2018.8535946"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.5931078"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09339916.pdf?arnumber=9339916","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:32Z","timestamp":1652194292000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9339916\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3055288","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}