{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,7]],"date-time":"2025-12-07T14:35:54Z","timestamp":1765118154158,"version":"3.37.3"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2017YFB1104700"],"award-info":[{"award-number":["2017YFB1104700"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875107"],"award-info":[{"award-number":["51875107"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Fudan University-CIOMP Joint Fund","award":["FC2018\u2013007"],"award-info":[{"award-number":["FC2018\u2013007"]}]},{"name":"SAST Fund","award":["2019-086"],"award-info":[{"award-number":["2019-086"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2021.3067954","type":"journal-article","created":{"date-parts":[[2021,3,22]],"date-time":"2021-03-22T19:55:17Z","timestamp":1616442917000},"page":"1-10","source":"Crossref","is-referenced-by-count":12,"title":["Adaptive Phase Correction for Phase Measuring Deflectometry Based on Light Field Modulation"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5732-989X","authenticated-orcid":false,"given":"Zhenqi","family":"Niu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3809-1262","authenticated-orcid":false,"given":"Xiangchao","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4357-105X","authenticated-orcid":false,"given":"Junqiang","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9601-6645","authenticated-orcid":false,"given":"Lu","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5983-370X","authenticated-orcid":false,"given":"Rui","family":"Zhu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7949-8507","authenticated-orcid":false,"given":"Xiangqian","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1364\/OE.20.012393"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/15599612.2014.942929"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.894185"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OE.390158"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.180"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"149","DOI":"10.1145\/2516971.2516974","article-title":"High-quality computational imaging through simple lenses","volume":"32","author":"heide","year":"2013","journal-title":"ACM Trans Graph"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.037541"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206743"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2006.145"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-016-0948-8"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.4.001373"},{"key":"ref28","doi-asserted-by":"crossref","first-page":"99610p","DOI":"10.1117\/12.2236520","article-title":"Zernike polynomials for mid-spatial frequency representation on optical surfaces","volume":"9961","author":"hosseinimakarem","year":"2016","journal-title":"Proc SPIE"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2020.03.011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2017.2761348"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.006945"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.008195"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.007523"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2962565"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.07.013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.06.001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.031172"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/AO.388143"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.4.001188"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2158229"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.62.000055"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206802"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.388651"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/PCS.2013.6737733"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/OE.14.006444"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms7225"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09383020.pdf?arnumber=9383020","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:02Z","timestamp":1652194262000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9383020\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3067954","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}