{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T14:54:59Z","timestamp":1784904899163,"version":"3.55.0"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075206"],"award-info":[{"award-number":["52075206"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875227"],"award-info":[{"award-number":["51875227"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2021.3067961","type":"journal-article","created":{"date-parts":[[2021,3,29]],"date-time":"2021-03-29T20:19:58Z","timestamp":1617049198000},"page":"1-9","source":"Crossref","is-referenced-by-count":18,"title":["Predistorting Projected Fringes for High-Accuracy 3-D Phase Mapping in Fringe Projection Profilometry"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7356-8789","authenticated-orcid":false,"given":"Jian","family":"Wang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6645-6647","authenticated-orcid":false,"given":"Zonghua","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5777-067X","authenticated-orcid":false,"given":"Richard K.","family":"Leach","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3998-2801","authenticated-orcid":false,"given":"Wenlong","family":"Lu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9356-9447","authenticated-orcid":false,"given":"Jianfeng","family":"Xu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1364\/OL.28.000887"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.04.022"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/1486525.1486527"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1364\/OL.38.001446"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1364\/OL.37.000542"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1364\/OE.19.005149"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1364\/AO.46.000036"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2018.09.002"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2020.08.008"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s40684-020-00248-w"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/AO.49.006563"},{"key":"ref40","article-title":"Camera calibration toolbox for MATLAB","author":"bouguet","year":"2010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.08.005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa5a2d"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OL.36.000627"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2012.10.015"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/34.888718"},{"key":"ref16","first-page":"1","article-title":"Novel method for structured light system calibration","volume":"45","author":"zhang","year":"2006","journal-title":"Opt Eng"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/OE.20.016926"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.001262"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/AO.383602"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.02.015"},{"key":"ref4","article-title":"Review of the system model and calibration for fringe projection profilometry","volume":"49","author":"yin","year":"2020","journal-title":"Infrared Laser Eng"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1364\/AO.58.004610"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107624"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab0ced"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511811685"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aae4fb"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2929281"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaf5bd"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.02.017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/OL.32.002438"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/978-0-7503-2524-0ch5"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.105870"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.10.013"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.52.10.104106"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.021846"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/2945.620490"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/AO.46.006113"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.10.015"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.04.009"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09389508.pdf?arnumber=9389508","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:31Z","timestamp":1652194291000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9389508\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3067961","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}