{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T15:19:56Z","timestamp":1776525596658,"version":"3.51.2"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2017YFA0701200"],"award-info":[{"award-number":["2017YFA0701200"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013287","name":"Science Challenge Project","doi-asserted-by":"publisher","award":["TZ2018006-0203-01"],"award-info":[{"award-number":["TZ2018006-0203-01"]}],"id":[{"id":"10.13039\/501100013287","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006606","name":"Natural Science Foundation of Tianjin","doi-asserted-by":"publisher","award":["18JCZDJC37000"],"award-info":[{"award-number":["18JCZDJC37000"]}],"id":[{"id":"10.13039\/501100006606","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2021.3071227","type":"journal-article","created":{"date-parts":[[2021,4,5]],"date-time":"2021-04-05T20:27:07Z","timestamp":1617654427000},"page":"1-13","source":"Crossref","is-referenced-by-count":15,"title":["Online Yarn Breakage Detection: A Reflection-Based Anomaly Detection Method"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2612-7985","authenticated-orcid":false,"given":"Ning","family":"Yan","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2680-9732","authenticated-orcid":false,"given":"Linlin","family":"Zhu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6051-9582","authenticated-orcid":false,"given":"Hongmai","family":"Yang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9740-0558","authenticated-orcid":false,"given":"Nana","family":"Li","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8469-7113","authenticated-orcid":false,"given":"Xiaodong","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2002.1017623"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1177\/004051759006000404"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1177\/0040517520928604"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-31654-9_45"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1177\/1558925020908268"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/3424978.3425080"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1973.4309314"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/BF00130487"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.5565\/rev\/elcvia.268"},{"key":"ref34","first-page":"128","article-title":"Deep learning vs. Traditional computer vision","author":"o\u2019mahony","year":"2019","journal-title":"Proc Sci Inf Conf"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2959292"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1986.4767754"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s140711957"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2016.7808528"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/s17112585"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2004.04.045"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMR.562-564.1840"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CISW.2007.4425643"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2209427"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2009.03.009"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2010.10.003"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1177\/0040517518813656"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.07.013"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1115\/1.4049535"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2009.03.008"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"796","DOI":"10.1063\/1.357751","article-title":"A new, optical-lever based atomic force microscope","volume":"76","author":"lal","year":"1994","journal-title":"J Appl Phys"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1177\/0040517519884124"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/12.957465"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISOT.2014.20"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0375-9601(02)00578-9"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICIA.2004.1373385"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2963555"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/70.88144"},{"key":"ref46","article-title":"YOLOv4: Optimal speed and accuracy of object detection","author":"bochkovskiy","year":"2020","journal-title":"arXiv 2004 10934"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2011.02.002"},{"key":"ref45","first-page":"3","article-title":"STL: A seasonal-trend decomposition","volume":"6","author":"cleveland","year":"1990","journal-title":"J Offic Statist"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2795178"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2020.103514"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/28.871274"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.53.9.093107"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/s18041064"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1119\/1.13295"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1117\/12.907268"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-31822-6"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1177\/0040517519862880"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.21474\/IJAR01\/10188"},{"key":"ref25","article-title":"Recent advances in deep learning: An overview","author":"minar","year":"2018","journal-title":"arXiv 1807 08169"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09395528.pdf?arnumber=9395528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:58:21Z","timestamp":1639771101000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9395528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3071227","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}