{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T15:55:31Z","timestamp":1784217331063,"version":"3.55.0"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1909217"],"award-info":[{"award-number":["U1909217"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51405346"],"award-info":[{"award-number":["51405346"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004731","name":"Zhejiang Provincial Natural Science Foundation of China","doi-asserted-by":"publisher","award":["LY20E050027"],"award-info":[{"award-number":["LY20E050027"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Wenzhou Key Innovation Project for Science and Technology of China","award":["ZD2019042"],"award-info":[{"award-number":["ZD2019042"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2021.3077995","type":"journal-article","created":{"date-parts":[[2021,5,6]],"date-time":"2021-05-06T19:24:44Z","timestamp":1620329084000},"page":"1-10","source":"Crossref","is-referenced-by-count":54,"title":["Sample Augmentation for Intelligent Milling Tool Wear Condition Monitoring Using Numerical Simulation and Generative Adversarial Network"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7674-7205","authenticated-orcid":false,"given":"Qinsong","family":"Zhu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2688-6949","authenticated-orcid":false,"given":"Bintao","family":"Sun","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8580-5427","authenticated-orcid":false,"given":"Yuqing","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4181-1606","authenticated-orcid":false,"given":"Weifang","family":"Sun","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4028-985X","authenticated-orcid":false,"given":"Jiawei","family":"Xiang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1613\/jair.953"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1243\/09544054JEM797"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1243\/09544054JEM796"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2916240"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1177\/1077546314545097"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2050974"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01663-1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2995586"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"178","DOI":"10.1504\/IJHM.2019.104386","article-title":"A review on the artificial neural network approach to analysis and prediction of seismic damage in infrastructure","volume":"2","author":"manouchehr","year":"2019","journal-title":"Int J Hydromechtron"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/app7040346"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-020-05890-x"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1115\/1.4036350"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/app6120414"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-04689-9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s18113866"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2968370"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2957107"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2205583"},{"key":"ref29","first-page":"46","article-title":"Finite element simulation and experiment of chip formation process during high speed machining of AISI 1045 hardened steel","volume":"1","author":"duan","year":"2009","journal-title":"Int J Recent Trends Eng"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2807414"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-018-1768-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2949355"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108186"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2961572"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2856193"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931487"},{"key":"ref22","first-page":"2672","article-title":"Generative adversarial networks","volume":"3","author":"goodfellow","year":"2014","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2020.105653"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.commatsci.2010.03.054"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.commatsci.2011.07.035"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"3797","DOI":"10.1109\/TIT.2014.2320500","article-title":"Rényi divergence and Kullback-Leibler divergence","volume":"60","author":"van","year":"2014","journal-title":"IEEE Trans Inf Theory"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2013.06.091"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09424633.pdf?arnumber=9424633","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:11Z","timestamp":1652194271000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9424633\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3077995","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}