{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:08:51Z","timestamp":1740132531160,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"Youth Program of National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11702262"],"award-info":[{"award-number":["11702262"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"CETC Funding","award":["6141B08231104"],"award-info":[{"award-number":["6141B08231104"]}]},{"name":"National Key Science and Technology on Solid-State Laser Laboratory Funding","award":["6142404180203"],"award-info":[{"award-number":["6142404180203"]}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61775045","61805054","62005063"],"award-info":[{"award-number":["61775045","61805054","62005063"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central University China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2021.3086905","type":"journal-article","created":{"date-parts":[[2021,11,22]],"date-time":"2021-11-22T20:47:16Z","timestamp":1637614036000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["Measurement of Residual Stress Based on a Ring FBG Array"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3001-7754","authenticated-orcid":false,"given":"Jianzhong","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6899-4676","authenticated-orcid":false,"given":"Tao","family":"Tan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4423-2156","authenticated-orcid":false,"given":"Chao","family":"Duan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2168-7986","authenticated-orcid":false,"given":"Zhuoshu","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4437-0970","authenticated-orcid":false,"given":"Xianghe","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3759-926X","authenticated-orcid":false,"given":"Quan","family":"Chai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6001-789X","authenticated-orcid":false,"given":"Gui","family":"Xiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5427-765X","authenticated-orcid":false,"given":"Ye","family":"Tian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0328-2173","authenticated-orcid":false,"given":"Weibin","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9311-8347","authenticated-orcid":false,"given":"Yao","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107892"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2017.11.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.13031\/jash.20.9858"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11223-019-00105-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.10.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.01.028"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1557\/jmr.2019.41"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/490\/2\/022082"},{"key":"ref9","first-page":"249","article-title":"Determination of inherent stresses by measuring deformations of drilled holes","volume-title":"Tech. Rep. Arch. Image Library","volume":"4","author":"Mathar","year":"1934"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.matdes.2017.06.051"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.polymertesting.2018.09.024"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.5772\/intechopen.90392"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/BF02327873"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/BF02317422"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1520\/JTE11856J"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1111\/j.1747-1567.1989.tb01435.x"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/pamm.201510090"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2016.03.032"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1243\/03093247v144171"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2676218"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/MSF.681.151"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2009.05.028"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09623551.pdf?arnumber=9623551","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:12:13Z","timestamp":1705025533000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9623551\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3086905","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}