{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T09:56:53Z","timestamp":1774519013763,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Shaanxi Key Laboratory of Complex System Control and Intelligent Information Processing, Xi\u2019an University of Technology","award":["2020CP07"],"award-info":[{"award-number":["2020CP07"]}]},{"name":"Key Scientific Research Projects of Colleges and Universities in Shandong Province","award":["2020VC12019"],"award-info":[{"award-number":["2020VC12019"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2021.3116306","type":"journal-article","created":{"date-parts":[[2021,9,29]],"date-time":"2021-09-29T20:42:27Z","timestamp":1632948147000},"page":"1-9","source":"Crossref","is-referenced-by-count":52,"title":["Triple <i>N<\/i>-Step Phase Shift Algorithm for Phase Error Compensation in Fringe Projection Profilometry"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6762-7439","authenticated-orcid":false,"given":"Jianhua","family":"Wang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1563-2425","authenticated-orcid":false,"given":"Yanxi","family":"Yang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/AO.46.000036"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/AO.43.002906"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OL.34.000416"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OL.34.002363"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2712862"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/AO.41.004503"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/AO.55.005721"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.025171"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.5025593"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/AO.56.007204"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3001413"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.06.024"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.04.019"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.60.2.020903"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2008.90"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2996510"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOT.2021.3052932"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.04.022"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2018.03.006"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s17122835"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.007703"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/1.3099720"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/AO.56.001591"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2017.05.026"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09551987.pdf?arnumber=9551987","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,22]],"date-time":"2021-11-22T20:50:33Z","timestamp":1637614233000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9551987\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3116306","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}