{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T16:47:56Z","timestamp":1770742076054,"version":"3.49.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Centre National d\u2019Etudes Spatiales (CNES) through the Nanoscan Project","award":["CNES N\u00b0 200111\/00"],"award-info":[{"award-number":["CNES N\u00b0 200111\/00"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2021.3126376","type":"journal-article","created":{"date-parts":[[2021,11,8]],"date-time":"2021-11-08T21:38:31Z","timestamp":1636407511000},"page":"1-15","source":"Crossref","is-referenced-by-count":26,"title":["Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4955-5915","authenticated-orcid":false,"given":"A.","family":"Boyer","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0615-6941","authenticated-orcid":false,"given":"N.","family":"Nolhier","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2166-9347","authenticated-orcid":false,"given":"F.","family":"Caignet","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5781-3737","authenticated-orcid":false,"given":"S. Ben","family":"Dhia","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2020.3008387"},{"key":"ref11","author":"sower","year":"1993","journal-title":"Standard Calibration Method for Electromagnetic Field Probes"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2945560"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/22.734563"},{"key":"ref14","first-page":"311","article-title":"Methodology of calibration of miniature near-field probes for quantitative characterization of IC radiation","author":"boyer","year":"2005","journal-title":"Proc of ICON"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218678"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2018.2817119"},{"key":"ref17","year":"2014","journal-title":"Integrated Circuits—Measurement of Electromagnetic Emissions—Part 3 Measurement of Radiated Emissions—Surface Scan Method"},{"key":"ref18","year":"2008","journal-title":"Integrated Circuits&#x2014 Measurement of Electromagnetic Emissions 150 kHz to 1 GHz&#x2014 Part 6 Measurement of Conducted Emissions&#x2014 Magnetic Probe Method"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2007.902194"},{"key":"ref4","first-page":"301","article-title":"A methodology for predicting disturbances due to near field chip to chip coupling","author":"boyer","year":"2007","journal-title":"Proc EMC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2015.7175400"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.1995.523603"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2015.2486041"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2010.0031"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2005.853165"},{"key":"ref2","article-title":"Design of magnetic probes for near-field measurements and the development of algorithms for the prediction of EMC","author":"sivaraman","year":"2017"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2004.1349988"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2010.2059030"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1971.1127633"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/22.392913"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1987.1133646"},{"key":"ref24","year":"2021","journal-title":"Software of Electromagnetic Simulations"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1968.0008"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09606650.pdf?arnumber=9606650","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:52:23Z","timestamp":1652194343000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9606650\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3126376","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}