{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T09:23:31Z","timestamp":1773393811823,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2021.3128691","type":"journal-article","created":{"date-parts":[[2021,11,16]],"date-time":"2021-11-16T20:27:37Z","timestamp":1637094457000},"page":"1-9","source":"Crossref","is-referenced-by-count":16,"title":["Performance Improvement of Transformer Differential Protection During Cross-Country Fault Using Hyperbolic S-Transform"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7204-1854","authenticated-orcid":false,"given":"Nassim","family":"Shahbazi","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3553-5510","authenticated-orcid":false,"given":"Sajad","family":"Bagheri","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1521-790X","authenticated-orcid":false,"given":"Gevork B.","family":"Gharehpetian","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3016966"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2929744"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2012.0047"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2016.1239"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2720691"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/9781118653838.ch1"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2009.2013663"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICAEE.2014.6838528"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2097281"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.04.015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EIConRus.2018.8317178"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2013.0407"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2011.01.021"},{"key":"ref14","first-page":"1129","article-title":"Coefficient comparison technique of discrete wavelet transform for discriminating between external short circuit and internal winding fault in power transformer","volume-title":"Proc. Int. Multi Conf. Eng. Comput. Sci.","volume":"2","author":"Pothisarn"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TLA.2018.8362151"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2016.7779634"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3007607"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2015.1486"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2575981"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s13198-016-0475-6"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2868491"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/KBEI.2019.8734991"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2764062"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3906\/elk-1107-35"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2010.513364"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2016.1686"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2998877"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2045518"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2808273"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09617457.pdf?arnumber=9617457","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T00:55:55Z","timestamp":1705020955000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9617457\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3128691","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}