{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,17]],"date-time":"2026-05-17T08:02:10Z","timestamp":1779004930910,"version":"3.51.4"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2021.3129210","type":"journal-article","created":{"date-parts":[[2021,11,19]],"date-time":"2021-11-19T15:29:35Z","timestamp":1637335775000},"page":"1-11","source":"Crossref","is-referenced-by-count":23,"title":["PMU-Based Voltage Stability Measurement Under Contingency Using ANN"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8921-7542","authenticated-orcid":false,"given":"Sanjay","family":"Kumar","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6277-3066","authenticated-orcid":false,"given":"Barjeev","family":"Tyagi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5055-1447","authenticated-orcid":false,"given":"Vishal","family":"Kumar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3714-4417","authenticated-orcid":false,"given":"Sunita","family":"Chohan","sequence":"additional","affiliation":[{"name":"Load Despatch and Communication Department, Power Grid Corporation of India Limited, Gurugram, Haryana, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2010.2044815"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2907756"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/59.651622"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2510598"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-021-01323-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.01.021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.1986.4308013"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/59.43177"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2012.03.022"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/59.141737"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2010.06.005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MPER.1992.161430"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/59.387897"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MPER.2002.4311799"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2932208"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.5630"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3004680"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2015.0232"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2792890"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/PSCE.2009.4840084"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IREP.2013.6629377"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2013.6682584"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS.2014.6965482"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2011.06.018"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2593358"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2939951"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/19.492803"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2009.2038059"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2012.12.019"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2011.06.008"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2015.05.002"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/NPSC.2014.7103798"},{"key":"ref33","volume-title":"Pattern Recognition: A Statistical Approach","author":"Devijver","year":"1982"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/59.207377"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/PESS.2001.970256"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.scient.2011.08.031"},{"issue":"2","key":"ref37","first-page":"215","article-title":"A comparative study of genetic algorithm and the particle swarm optimization","volume":"9","author":"Shabir","year":"2016","journal-title":"Int. J. Electr. Eng."},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ICNN.1995.488968"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2009.12.026"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09620193.pdf?arnumber=9620193","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T17:38:44Z","timestamp":1759340324000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9620193\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3129210","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}