{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T06:48:31Z","timestamp":1769928511460,"version":"3.49.0"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003764","name":"Science and Technology Project of China National Offshore Oil Corporation","doi-asserted-by":"publisher","award":["CNOOC-KJ ZDHXJSGG YF 2019-02"],"award-info":[{"award-number":["CNOOC-KJ ZDHXJSGG YF 2019-02"]}],"id":[{"id":"10.13039\/501100003764","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2021.3130671","type":"journal-article","created":{"date-parts":[[2021,11,25]],"date-time":"2021-11-25T20:24:19Z","timestamp":1637871859000},"page":"1-12","source":"Crossref","is-referenced-by-count":5,"title":["Fracture Identification in Well Logging Images: Two-Stage Adaptive Network"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1218-9475","authenticated-orcid":false,"given":"Wei","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0415-087X","authenticated-orcid":false,"given":"Zhipeng","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3584-6693","authenticated-orcid":false,"given":"Tong","family":"Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8793-2964","authenticated-orcid":false,"given":"Zhenqiu","family":"Yao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1433-2415","authenticated-orcid":false,"given":"Ao","family":"Qiu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3971-9795","authenticated-orcid":false,"given":"Yanjun","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6521-972X","authenticated-orcid":false,"given":"Yibing","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.marpetgeo.2017.03.035"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-77501-2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2014.6825388"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11004-016-9649-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1143268"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-53383-3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.marpetgeo.2018.04.020"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICOSP.2002.1181204"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/WiCOM.2012.6478495"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CFIS.2017.8003674"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1190\/segam2015-5929124.1"},{"key":"ref12","first-page":"43","article-title":"An edge based segmentation algorithm for rock fracture tracing","volume-title":"Proc. Int. Conf. Comput. Graph., Imag. Vis. (CGIV)","author":"Wang"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2516\/ogst\/2020086"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2020.9200875"},{"key":"ref15","article-title":"A review on deep learning techniques applied to semantic segmentation","author":"Garcia-Garcia","year":"2017","journal-title":"arXiv:1704.06857"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2572683"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2644615"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2017.2699184"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2016.60"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.22260\/ISARC2018\/0094"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3040939"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2959292"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3075022"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS47720.2021.9554264"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-020-09825-6"},{"key":"ref27","article-title":"Domain stylization: A strong, simple baseline for synthetic to real image domain adaptation","author":"Dundar","year":"2018","journal-title":"arXiv:1807.09384"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00414"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00262"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00780"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00261"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00194"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2019.00160"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1162\/tacl_a_00097"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2913372"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2867261"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.265"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2019.2910595"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00712"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-011-0841-3"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09627090.pdf?arnumber=9627090","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T19:12:06Z","timestamp":1709320326000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9627090\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3130671","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}