{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T07:16:20Z","timestamp":1760080580405,"version":"3.37.3"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Key Advance Research Projects of Equipment Development of China","award":["41417100101"],"award-info":[{"award-number":["41417100101"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2021.3134747","type":"journal-article","created":{"date-parts":[[2021,12,10]],"date-time":"2021-12-10T20:31:28Z","timestamp":1639168288000},"page":"1-9","source":"Crossref","is-referenced-by-count":6,"title":["Magnetoresistive Sensor Error Compensation Method Using Geometry-Constraint Contour Scaling"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6252-4059","authenticated-orcid":false,"given":"Jinwen","family":"Wang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0226-0626","authenticated-orcid":false,"given":"Zhihong","family":"Deng","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5276-0464","authenticated-orcid":false,"given":"Zhidong","family":"Meng","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3541-6108","authenticated-orcid":false,"given":"Kai","family":"Shen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/1.JRS.10.014001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2914574"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s21165475"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3011764"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.2514\/1.G005305"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2014.2360335"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2787578"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2880079"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/9\/095003"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2115330"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3060594"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2950841"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/4514873"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s20020535"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2017.2670527"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ROSE.2011.6058522"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1186\/s40623-015-0228-9"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3007210"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09646901.pdf?arnumber=9646901","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T21:16:22Z","timestamp":1709327782000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9646901\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3134747","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}