{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:42:09Z","timestamp":1777657329675,"version":"3.51.4"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875232"],"award-info":[{"award-number":["51875232"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875233"],"award-info":[{"award-number":["51875233"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["42074216"],"award-info":[{"award-number":["42074216"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007847","name":"Natural Science Foundation of Jilin Province","doi-asserted-by":"publisher","award":["20210101382JC"],"award-info":[{"award-number":["20210101382JC"]}],"id":[{"id":"10.13039\/100007847","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2021.3138498","type":"journal-article","created":{"date-parts":[[2021,12,24]],"date-time":"2021-12-24T20:25:47Z","timestamp":1640377547000},"page":"1-14","source":"Crossref","is-referenced-by-count":43,"title":["Deep Learning and Machine Vision-Based Inspection of Rail Surface Defects"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7016-8867","authenticated-orcid":false,"given":"Hongfei","family":"Yang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4039-9215","authenticated-orcid":false,"given":"Yanzhang","family":"Wang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2996-0083","authenticated-orcid":false,"given":"Jiyong","family":"Hu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9367-5300","authenticated-orcid":false,"given":"Jiatang","family":"He","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0522-2468","authenticated-orcid":false,"given":"Zongwei","family":"Yao","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6997-3861","authenticated-orcid":false,"given":"Qiushi","family":"Bi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1111\/risa.12836"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2909940"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2803830"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0043-1648(95)06674-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s13198-011-0074-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/02564602.2015.1113145"},{"issue":"10","key":"ref7","first-page":"2272","article-title":"Study on B-scan imaging detection for rail tread tilted cracks using ultrasonic surface wave","volume":"31","author":"Lu","year":"2010","journal-title":"Chin. J. Sci. Instrum."},{"key":"ref8","first-page":"217","article-title":"IR-termography methods for the defects detection IA railway wheels","volume-title":"Proc. 7th Int. Conf. Actual Problems Electron. Instrum. Eng.","author":"Verkhoglyad"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151352"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICIAP.2001.957064"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2014.2388435"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.06.020"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2017.7915495"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2871353"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2014.07.059"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2012.6252468"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-14249-4_64"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICNC.2007.226"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3724\/SP.J.1087.2013.00049"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SoCPaR.2009.83"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/3477.764879"},{"key":"ref23","first-page":"39","article-title":"FCM algorithm for the research of intensity image segmentation","volume":"25","author":"Ding","year":"1997","journal-title":"Acta Electronica Sinica"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/SERIES1345"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-006-7934-5"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICINIS.2010.181"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/21.478444"},{"key":"ref28","first-page":"1","article-title":"Very deep convolutional networks for large-scale image recognition","volume-title":"Proc. 3rd Int. Conf. Learn. Represent.","author":"Simonyan"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2572683"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.660"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2016.7727522"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2015.7350873"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2016.2568758"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2774242"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775345"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09663173.pdf?arnumber=9663173","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,10]],"date-time":"2024-01-10T00:26:56Z","timestamp":1704846416000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9663173\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/tim.2021.3138498","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}