{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,17]],"date-time":"2026-06-17T16:29:43Z","timestamp":1781713783431,"version":"3.54.5"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Project of China","doi-asserted-by":"publisher","award":["2020YFF0217803"],"award-info":[{"award-number":["2020YFF0217803"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3147327","type":"journal-article","created":{"date-parts":[[2022,2,3]],"date-time":"2022-02-03T20:20:19Z","timestamp":1643919619000},"page":"1-8","source":"Crossref","is-referenced-by-count":17,"title":["Temperature-Compensated High-Sensitivity Relative Humidity Sensor Based on Band-Pass Filtering and Vernier Effect"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6001-4020","authenticated-orcid":false,"given":"Changgui","family":"Yu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2708-3681","authenticated-orcid":false,"given":"Huaping","family":"Gong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5767-2444","authenticated-orcid":false,"given":"Zhaoxu","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6736-0532","authenticated-orcid":false,"given":"Kai","family":"Ni","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2683-3882","authenticated-orcid":false,"given":"Chunliu","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2933561"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.037308"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2019.2906648"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/AO.58.000410"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/OL.43.005355"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OL.44.004833"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2019.2926066"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CLEOPR.2017.8118967"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2019.2936174"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2019.163181"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.017239"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACP.2018.8596013"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3008167"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2020.128981"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3034154"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2019.2901571"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2018.11.042"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OE.421060"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.028649"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/AO.57.000872"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09703319.pdf?arnumber=9703319","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:34:09Z","timestamp":1705534449000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9703319\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3147327","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}