{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T05:20:15Z","timestamp":1782969615629,"version":"3.54.5"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973119"],"award-info":[{"award-number":["61973119"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013105","name":"Shanghai Rising-Star Program","doi-asserted-by":"publisher","award":["20QA1402600"],"award-info":[{"award-number":["20QA1402600"]}],"id":[{"id":"10.13039\/501100013105","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3147887","type":"journal-article","created":{"date-parts":[[2022,1,31]],"date-time":"2022-01-31T22:10:29Z","timestamp":1643667029000},"page":"1-11","source":"Crossref","is-referenced-by-count":24,"title":["Distributed Robust Process Monitoring Based on Optimized Denoising Autoencoder With Reinforcement Learning"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2678-8153","authenticated-orcid":false,"given":"Shutian","family":"Chen","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3402-9018","authenticated-orcid":false,"given":"Qingchao","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3040485"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3084305"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.23249"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b02391"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3075754"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2015.10.006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.05.002"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2998467"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2886048"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2345331"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2668986"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2019.2897946"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2020.05.010"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.10.011"},{"key":"ref17","first-page":"1","article-title":"Deep learning enabled fault diagnosis using time-frequency image analysis of rolling element bearings","volume":"2017","author":"Example","year":"2017","journal-title":"Shock Vib."},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.05.050"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2509247"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2893125"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2855189"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2020.06.062"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.2985223"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-05318-5_3"},{"key":"ref25","article-title":"Neural architecture search with reinforcement learning","volume-title":"arXiv:1611.01578","author":"Zoph","year":"2016"},{"issue":"3","key":"ref26","doi-asserted-by":"crossref","first-page":"279","DOI":"10.1007\/BF00992698","article-title":"Q-learning","volume":"8","author":"Watkins","year":"1992","journal-title":"Mach. Learn."},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-91253-0_26"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2938890"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/1390156.1390294"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1038\/nature14236"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0347-9_8"},{"key":"ref32","article-title":"Attention is all you need","volume-title":"arXiv:1706.03762","author":"Vaswani","year":"2017"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2866549"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09698017.pdf?arnumber=9698017","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:17:52Z","timestamp":1705533472000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9698017\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3147887","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}