{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T19:07:02Z","timestamp":1774033622512,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Innovative Research Call in Explosives and Weapons Detection","award":["DSTLX1000155414"],"award-info":[{"award-number":["DSTLX1000155414"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3147899","type":"journal-article","created":{"date-parts":[[2022,1,31]],"date-time":"2022-01-31T22:10:29Z","timestamp":1643667029000},"page":"1-11","source":"Crossref","is-referenced-by-count":18,"title":["Dual-Comb Scanning Spectrometer for Remote Sensing of Traces of Explosives"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5400-913X","authenticated-orcid":false,"given":"John","family":"Macarthur","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9704-2538","authenticated-orcid":false,"given":"Jakob","family":"Hayden","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9782-6690","authenticated-orcid":false,"given":"Matthew S.","family":"Warden","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6331-3579","authenticated-orcid":false,"given":"Christopher","family":"Carson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6135-5153","authenticated-orcid":false,"given":"David M.","family":"Stothard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5261-1186","authenticated-orcid":false,"given":"Vasili G.","family":"Savitski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Full Body Scanners for Shopping Security","year":"2020"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.831455"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2215156"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2499760"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2922170"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1117\/12.840464"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1366\/14-07560"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.5079622"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.59.9.092009"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1117\/12.2558485"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2019.2957484"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/jrs.4868"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.trac.2017.12.014"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.57.1.011010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.3.000414"},{"key":"ref16","article-title":"Standoff detection from diffusely scattering surfaces using dual quantum cascade laser comb spectroscopy","volume-title":"Proc. SPIE","volume":"10638","author":"Hensley"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms6192"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OPEX.13.009029"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.1c00666"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.proci.2016.06.032"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/nature11620"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-020-07545-x"},{"key":"ref23","volume-title":"Methodology for Analysis of Soluble Salts From Steel Substrates","year":"2014"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/39827"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1177\/0003702818780414"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.003547"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-012-5134-2"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/2730371"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.025364"},{"key":"ref30","article-title":"Baseline correction with asymmetric least squares smoothing","author":"Eilers","year":"2005"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1364\/AO.51.002794"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jctc.0c00126"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.tjem.2018.08.001"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2013.10.026"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1039\/C4AN01061B"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1039\/C4AY00068D"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3390\/s20072015"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.15278\/isms.2018.tg03"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.8b02531"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09698024.pdf?arnumber=9698024","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:26:16Z","timestamp":1705533976000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9698024\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3147899","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}