{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T09:55:35Z","timestamp":1756461335234,"version":"3.37.3"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3150877","type":"journal-article","created":{"date-parts":[[2022,2,10]],"date-time":"2022-02-10T20:22:04Z","timestamp":1644524524000},"page":"1-14","source":"Crossref","is-referenced-by-count":7,"title":["<i>In Situ<\/i> Direct Magnetic Loss Measurement With Improved Accuracy for Lossier Magnetics"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8826-450X","authenticated-orcid":false,"given":"Lifang","family":"Yi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1331-348X","authenticated-orcid":false,"given":"Jinyeong","family":"Moon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2652318"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2019.1301"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2284248"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2506400"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2686360"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2980313"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2160971"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2842064"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2837657"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2453055"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2761127"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2867264"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.1988.10582"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2000.822571"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2016.7695644"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2005.848775"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2012.6396949"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8876"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2897787"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2009.5361568"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2043693"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2047302"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908119"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2019.8913211"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3015182"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/OJPEL.2020.3005879"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09709833.pdf?arnumber=9709833","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:09:00Z","timestamp":1705532940000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9709833\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3150877","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}