{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T16:46:51Z","timestamp":1765039611938,"version":"3.37.3"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100013098","name":"Shanghai 2020 \u201cScience and Technology Innovation Action Plan\u201d Scientific Instrument Field Project","doi-asserted-by":"publisher","award":["20142200200"],"award-info":[{"award-number":["20142200200"]}],"id":[{"id":"10.13039\/501100013098","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3152861","type":"journal-article","created":{"date-parts":[[2022,2,18]],"date-time":"2022-02-18T20:25:59Z","timestamp":1645215959000},"page":"1-9","source":"Crossref","is-referenced-by-count":3,"title":["Electrical Compensation for Magnetization Distortion of Magnetic Fluxgate Current Sensor"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0431-3621","authenticated-orcid":false,"given":"Yutong","family":"Wei","sequence":"first","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0185-0931","authenticated-orcid":false,"given":"Cheng","family":"Li","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9293-0613","authenticated-orcid":false,"given":"Wenlei","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3870-8007","authenticated-orcid":false,"given":"Mingyu","family":"Xue","sequence":"additional","affiliation":[{"name":"Shanghai United-Imaging Healthcare Company, Ltd., Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5040-5079","authenticated-orcid":false,"given":"Bin","family":"Cao","sequence":"additional","affiliation":[{"name":"Shanghai United-Imaging Healthcare Company, Ltd., Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0816-5603","authenticated-orcid":false,"given":"Xu","family":"Chu","sequence":"additional","affiliation":[{"name":"Shanghai United-Imaging Healthcare Company, Ltd., Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6421-2024","authenticated-orcid":false,"given":"Chaofeng","family":"Ye","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/11\/112001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1515\/teme-2019-0032"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/20.706529"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2358671"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2054831"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2009.2013914"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2524042"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1117\/12.665234"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2002.1006923"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2005.09.047"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EPEPEMC.2008.4635463"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2006.02.004"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1166\/sl.2009.1078"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.03.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2292834"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2004.05.011"},{"volume-title":"Current transducer with fluxgate detector","year":"2016","author":"Teppan","key":"ref17"},{"article-title":"Current sensor with fluxgate","year":"2018","author":"Guillot","key":"ref18"},{"article-title":"Closed-loop current transducer with switched mode amplifier","year":"2012","author":"Schaerrer","key":"ref19"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2134055"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2894302"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09717229.pdf?arnumber=9717229","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T22:57:49Z","timestamp":1705532269000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9717229\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3152861","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}