{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T06:48:29Z","timestamp":1757314109299,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973018","62173039"],"award-info":[{"award-number":["61973018","62173039"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Civil Aerospace Technology Project of China","award":["D040301"],"award-info":[{"award-number":["D040301"]}]},{"DOI":"10.13039\/501100012236","name":"Beijing Institute of Technology Research Fund Program for Young Scholars","doi-asserted-by":"publisher","award":["2020CX04104"],"award-info":[{"award-number":["2020CX04104"]}],"id":[{"id":"10.13039\/501100012236","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3156995","type":"journal-article","created":{"date-parts":[[2022,3,4]],"date-time":"2022-03-04T20:19:48Z","timestamp":1646425188000},"page":"1-7","source":"Crossref","is-referenced-by-count":11,"title":["Moving Target Imaging via Computational Ghost Imaging Combined With Artificial Bee Colony Optimization"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1713-1632","authenticated-orcid":false,"given":"Yuanjin","family":"Yu","sequence":"first","affiliation":[{"name":"School of Automation, Beijing Institute of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2185-7746","authenticated-orcid":false,"given":"Jiali","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Automation, Beijing Institute of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2190-782X","authenticated-orcid":false,"given":"Shizhuang","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Automation, Beijing Institute of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1481-9952","authenticated-orcid":false,"given":"Zhaohua","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Instrumentation Science and Opto-Electronics Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/physreva.52.r3429"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/physrevlett.93.093602"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/aop.2.000405"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11128-011-0356-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1464-4266\/4\/3\/372"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2019.02.036"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1364\/OL.42.005290"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/OE.394639"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2898051"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.4757874"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/srep24752"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2013.2267203"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.78.061802"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2329387"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1117\/1.3662429"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3788\/cjl201239.1214003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2994579"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/prj.3.000153"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106450"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ipr.2018.5741"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1364\/oe.27.027851"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/oe.387024"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/oe.412597"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/oe.410191"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/app10217941"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.4885764"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1364\/oe.27.012841"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2009.03.090"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s10898-007-9149-x"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2007.05.007"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1038\/s41566-018-0300-7"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1364\/AO.9.001392"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1364\/josaa.35.000078"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09729222.pdf?arnumber=9729222","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T00:11:08Z","timestamp":1705536668000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9729222\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3156995","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}