{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T16:01:50Z","timestamp":1783008110413,"version":"3.54.5"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100015401","name":"Key Research and Development Program of Shaanxi Province","doi-asserted-by":"publisher","award":["2022GY-274"],"award-info":[{"award-number":["2022GY-274"]}],"id":[{"id":"10.13039\/501100015401","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific Research Program Foundation of Shaanxi Provincial Education Department","award":["20JY053"],"award-info":[{"award-number":["20JY053"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3162286","type":"journal-article","created":{"date-parts":[[2022,3,25]],"date-time":"2022-03-25T19:37:48Z","timestamp":1648237068000},"page":"1-11","source":"Crossref","is-referenced-by-count":45,"title":["Pixel-Wise Semisupervised Fabric Defect Detection Method Combined With Multitask Mean Teacher"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3251-5880","authenticated-orcid":false,"given":"Linhao","family":"Shao","sequence":"first","affiliation":[{"name":"School of Printing, Packaging and Digital Media Technology, Xi&#x2019;an University of Technology, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6755-0694","authenticated-orcid":false,"given":"Erhu","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Printing, Packaging and Digital Media Technology, Xi&#x2019;an University of Technology, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9775-1032","authenticated-orcid":false,"given":"Qiurui","family":"Ma","sequence":"additional","affiliation":[{"name":"School of Mechanical and Precision Instrument Engineering, Xi&#x2019;an University of Technology, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8243-9687","authenticated-orcid":false,"given":"Mei","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mechanical and Precision Instrument Engineering, Xi&#x2019;an University of Technology, Xi&#x2019;an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(01)00188-1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/29.45554"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/GlobalSIP.2015.7418420"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2997718"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298965"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1177\/1558925019897396"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2020.05.050"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01261-8_20"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-00889-5_1"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00959"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-32692-0_34"},{"key":"ref15","first-page":"1196","article-title":"Mean teachers are better role models: Weight-averaged consistency targets improve semi-supervised deep learning results","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Tarvainen"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.273"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISBI.2018.8363791"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-55860-307-3.50012-5"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/kem.671.369"},{"key":"ref20","article-title":"Research on fabric defect recognition and classification algorithm based on wavelet analysis and SVM","author":"Zhe","year":"2017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/12.2244861"},{"issue":"18","key":"ref22","first-page":"167","article-title":"Automatic detection of fabric surface texture defects","volume":"35","author":"Shengqi","year":"2009","journal-title":"Comput. Eng."},{"issue":"5","key":"ref23","first-page":"32","article-title":"Texture image recognition based on Gabor feature and local binary pattern fusion","volume":"34","author":"Junmin","year":"2019","journal-title":"J. Pingdingshan Univ."},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2020.3001122"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.10.067"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108885"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/AI4I49448.2020.00018"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3047190"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2009.5459469"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00565"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2015.09.022"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.2478\/aut-2019-0035"},{"key":"ref34","volume-title":"Workgroup on Texture Analysis of DFG TILDA Textile Texture Database","year":"1996"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.660"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2644615"},{"key":"ref37","article-title":"Rethinking atrous convolution for semantic image segmentation","volume-title":"Proc. IEEE Conf. Comput. Vis. Pattern Recognit. (CVPR)","author":"Chen"},{"key":"ref38","first-page":"1","article-title":"Very deep convolutional networks for large-scale image recognition","volume-title":"Proc. Int. Conf. Learn. Represent. (ICLR)","author":"Simonyan"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.308"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2018.07.005"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09741850.pdf?arnumber=9741850","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T00:28:40Z","timestamp":1705537720000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9741850\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3162286","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}