{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T00:32:07Z","timestamp":1787013127539,"version":"3.56.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3164156","type":"journal-article","created":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T15:48:52Z","timestamp":1648828132000},"page":"1-9","source":"Crossref","is-referenced-by-count":19,"title":["Recognition of Hydrophobicity Class of Polymeric Insulators Employing Residual Morphological Neural Network and Granulometry-Based Image Analysis"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4162-4472","authenticated-orcid":false,"given":"Soumya","family":"Chatterjee","sequence":"first","affiliation":[{"name":"Electrical and Electronics Engineering Department, Birla Institute of Technology Mesra, Ranchi, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8918-8895","authenticated-orcid":false,"given":"Sayanjit Singha","family":"Roy","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, National Institute of Technology Silchar, Silchar, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8144-0213","authenticated-orcid":false,"given":"Arpan","family":"Chatterjee","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Meghnad Saha Institute of Technology, Kolkata, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7139-5853","authenticated-orcid":false,"given":"Biswarup","family":"Ganguly","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Meghnad Saha Institute of Technology, Kolkata, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7242-5652","authenticated-orcid":false,"given":"Subho","family":"Paul","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2959855"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2008.2005654"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EPETSG.2015.7510067"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3098793"},{"key":"ref5","volume-title":"Guidance on the Measurement of Wettability of Insulator Surfaces","year":"2016"},{"key":"ref6","volume-title":"Guide 92\/1 Hydrophobicity Classification Guide","year":"1992"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/94.971470"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1590\/S1516-14392008000400006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1590\/s1516-14392012005000032"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2014.004523"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1590\/1516-1439.286414"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2922279"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2956300"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2965635"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2021.009617"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2020.3002991"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2020.103613"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107246"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-03939-7"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2018.2890334"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2856466"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAS.2014.6987868"},{"key":"ref23","first-page":"249","article-title":"Understanding the difficulty of training deep feedforward neural networks","volume-title":"Proc. 13th Int. Conf. Artif. Intell. Statist.","author":"Glorot"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4543114"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09745943.pdf?arnumber=9745943","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T19:33:11Z","timestamp":1705519991000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9745943\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3164156","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}