{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,16]],"date-time":"2025-04-16T06:00:51Z","timestamp":1744783251006,"version":"3.37.3"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science through the Grant-in-Aid for Scientific Research","doi-asserted-by":"publisher","award":["20H02630"],"award-info":[{"award-number":["20H02630"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3165249","type":"journal-article","created":{"date-parts":[[2022,4,6]],"date-time":"2022-04-06T19:29:00Z","timestamp":1649273340000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Finite-Element Simulation of Effect of Surface Roughness of Coaxial Cylindrical Electrodes on Small Mass and Force Measurements Using Voltage Balance Apparatus"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7830-3111","authenticated-orcid":false,"given":"Kazuaki","family":"Fujita","sequence":"first","affiliation":[{"name":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4375-5214","authenticated-orcid":false,"given":"Naoki","family":"Kuramoto","sequence":"additional","affiliation":[{"name":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0264-9381\/26\/24\/245011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.86.1391"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/ab4641"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aa8d2d"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/ab0013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/53\/5\/A86"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2886867"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aaf9c2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaac51"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2890747"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.377912"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3001408"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3052020"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/1857920"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.1745162"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.60.9157"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2692(02)00105-2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4919817"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1098(01)00057-6"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b06451"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/27\/7\/024"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.3129503"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.2005376"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.measen.2021.100143"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/25\/11\/115006"},{"volume-title":"Introduction to the Finite Element Method","year":"2019","author":"Reddy","key":"ref26"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2005.10.008"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.113544"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa5e15"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.48.14472"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09750111.pdf?arnumber=9750111","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T00:22:56Z","timestamp":1705537376000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9750111\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3165249","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}