{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T16:57:11Z","timestamp":1784998631594,"version":"3.55.0"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61903127"],"award-info":[{"award-number":["61903127"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51837011"],"award-info":[{"award-number":["51837011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["31900978"],"award-info":[{"award-number":["31900978"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61771475"],"award-info":[{"award-number":["61771475"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"Postdoctoral Science Foundation of China","doi-asserted-by":"publisher","award":["2020M673664"],"award-info":[{"award-number":["2020M673664"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017664","name":"Foundation for University Key Young Teacher by Henan Province of China","doi-asserted-by":"publisher","award":["2020GGJS061"],"award-info":[{"award-number":["2020GGJS061"]}],"id":[{"id":"10.13039\/501100017664","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific and Technological Innovation Program for Universities in Henan Province of China","award":["21HASTIT018"],"award-info":[{"award-number":["21HASTIT018"]}]},{"DOI":"10.13039\/501100006407","name":"Natural Science Foundation of Henan Province of China","doi-asserted-by":"publisher","award":["212300410055"],"award-info":[{"award-number":["212300410055"]}],"id":[{"id":"10.13039\/501100006407","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100009555","name":"Scientific Research Project for Postgraduates of Henan Normal University of China","doi-asserted-by":"publisher","award":["YL202105"],"award-info":[{"award-number":["YL202105"]}],"id":[{"id":"10.13039\/100009555","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3165786","type":"journal-article","created":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T15:23:42Z","timestamp":1649431422000},"page":"1-11","source":"Crossref","is-referenced-by-count":17,"title":["Residual Convolutional Neural Network-Based Stroke Classification With Electrical Impedance Tomography"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2759-0015","authenticated-orcid":false,"given":"Yanyan","family":"Shi","sequence":"first","affiliation":[{"name":"Henan Key Laboratory of Optoelectronic Sensing Integrated Application, College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7966-3709","authenticated-orcid":false,"given":"Zhiwei","family":"Tian","sequence":"additional","affiliation":[{"name":"College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4230-1365","authenticated-orcid":false,"given":"Meng","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0580-8837","authenticated-orcid":false,"given":"Yuehui","family":"Wu","sequence":"additional","affiliation":[{"name":"College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7802-3593","authenticated-orcid":false,"given":"Bin","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1903-668X","authenticated-orcid":false,"given":"Feng","family":"Fu","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"issue":"9624","key":"ref1","doi-asserted-by":"crossref","first-page":"1612","DOI":"10.1016\/S0140-6736(08)60694-7","article-title":"Stroke","volume":"371","author":"Donnan","year":"2008","journal-title":"Lancet"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.5830\/cvja-2013-001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1212\/WNL.0000000000004904"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2021.08.023"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1177\/0846537121998961"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3013056"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2965202"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2021.3104300"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2020.3025080"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1164\/rccm.202008-3044IM"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2928580"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/1.JMI.8.1.014501"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s11517-019-02003-z"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/36\/6\/1273"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2488901"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2012.2188398"},{"key":"ref17","first-page":"21","volume-title":"Electrical Impedance Tomography: Methods, History and Applications","author":"Holder","year":"2005"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2853358"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2021.101917"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2015.2509508"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2970371"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2013.2280632"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2002.800572"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0200469"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6420\/abbdcd"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/36\/6\/1179"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/37\/1\/1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2018.2821699"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.32604\/csse.2022.019333"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3008908"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3092524"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2900349"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/10.784147"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/37\/6\/765"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/9996958"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3934\/mbe.2020328"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3077988"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2987287"},{"key":"ref39","first-page":"1","article-title":"Striving for simplicity: The all convolutional net","volume-title":"Proc. Int. Conf. Learn. Represent. (ICLR)","author":"Springenberg"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2020.2977531"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2978568"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/s11434-012-5644-7"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.4067\/S0717-95022012000400033"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6579\/aa8016"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2836336"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09751762.pdf?arnumber=9751762","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T20:57:26Z","timestamp":1771534646000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9751762\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":45,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3165786","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}