{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T07:15:02Z","timestamp":1761808502911,"version":"3.37.3"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62073222","U21A20480","U1913204"],"award-info":[{"award-number":["62073222","U21A20480","U1913204"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003399","name":"Science and Technology Commission of Shanghai Municipality","doi-asserted-by":"publisher","award":["21511101900"],"award-info":[{"award-number":["21511101900"]}],"id":[{"id":"10.13039\/501100003399","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Open Research Projects of Zhejiang Laboratory","award":["2022NB0AB01"],"award-info":[{"award-number":["2022NB0AB01"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3166147","type":"journal-article","created":{"date-parts":[[2022,4,11]],"date-time":"2022-04-11T20:26:52Z","timestamp":1649708812000},"page":"1-9","source":"Crossref","is-referenced-by-count":17,"title":["Residual 3-D Scene Flow Learning With Context-Aware Feature Extraction"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7675-543X","authenticated-orcid":false,"given":"Guangming","family":"Wang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4895-7720","authenticated-orcid":false,"given":"Yunzhe","family":"Hu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7904-2374","authenticated-orcid":false,"given":"Xinrui","family":"Wu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9959-1634","authenticated-orcid":false,"given":"Hesheng","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2021.3111888"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3072779"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2022.3162207"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3106101"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3124954"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3109718"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01565"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00062"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-015-0806-0"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.isprsjprs.2017.09.013"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.16"},{"key":"ref12","first-page":"5105","article-title":"PointNet++ deep hierarchical feature learning on point sets in a metric space","volume-title":"Proc. NIPS","author":"Qi"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00337"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58558-7_6"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58604-1_32"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00410"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00043"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3079796"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2015.7353481"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.114"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00268"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.482"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3326362"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01112"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01119"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00931"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.01024"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00359"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3002277"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.438"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01258-8_38"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1117\/12.57955"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09754543.pdf?arnumber=9754543","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,19]],"date-time":"2024-01-19T18:14:11Z","timestamp":1705688051000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9754543\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3166147","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}