{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T16:07:57Z","timestamp":1775146077383,"version":"3.50.1"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010880","name":"Science and Technology Project of State Grid Corporation of China","doi-asserted-by":"publisher","award":["5400-202119145A-0-0-00"],"award-info":[{"award-number":["5400-202119145A-0-0-00"]}],"id":[{"id":"10.13039\/501100010880","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3169548","type":"journal-article","created":{"date-parts":[[2022,4,22]],"date-time":"2022-04-22T19:32:13Z","timestamp":1650655933000},"page":"1-10","source":"Crossref","is-referenced-by-count":35,"title":["An Efficient Cross-Terms Suppression Method in Time\u2013Frequency Domain Reflectometry for Cable Defect Localization"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0793-2500","authenticated-orcid":false,"given":"Xing-Yu","family":"Zou","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and the State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8790-6336","authenticated-orcid":false,"given":"Hai-Bao","family":"Mu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and the State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0025-9069","authenticated-orcid":false,"given":"Hao-Tian","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and the State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9480-9390","authenticated-orcid":false,"given":"Lan-Qing","family":"Qu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and the State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1518-1978","authenticated-orcid":false,"given":"Yi-Fan","family":"He","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and the State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1859-0443","authenticated-orcid":false,"given":"Guan-Jun","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and the State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.006837"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2444260"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2997696"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3087816"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2896553"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2304353"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2974110"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/T-AIEE.1948.5059797"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2770778"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2294193"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2834179"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005521"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2386918"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.004799"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3092514"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3071685"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2664578"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2680459"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S1004-4132(08)60196-6"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2005.845390"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2286581"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.858115"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.861328"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2009.2020767"},{"key":"ref25","volume-title":"Coaxial Communication Cables\u2014Part 1\u2013108: Electrical Test Methods Test for Characteristic Impedance, Phase and Group Delay, Electrical Length and Propagation Velocity","year":"2011"},{"key":"ref26","volume-title":"Radio-Frequency Connectors\u2014Part 8: Sectional Specification RF Coaxial Connectors With Inner Diameter of Outer Conductor 6,5 mm (0,256 in) With Bayonet Lock Characteristic Impedance 50 (Type BNC)","year":"2007"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09761861.pdf?arnumber=9761861","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:08:02Z","timestamp":1705957682000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9761861\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3169548","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}