{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T03:27:07Z","timestamp":1776223627452,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Department of Science and Technology Government of India"},{"name":"Technology Innovation Hub"},{"name":"Indian Institute of Technology Ropar in the framework of National Mission on Interdisciplinary CyberPhysical Systems NM ICPS"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3175059","type":"journal-article","created":{"date-parts":[[2022,5,13]],"date-time":"2022-05-13T19:26:17Z","timestamp":1652469977000},"page":"1-11","source":"Crossref","is-referenced-by-count":33,"title":["TEMPSENSE: LoRa Enabled Integrated Sensing and Localization Solution for Water Quality Monitoring"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2612-0030","authenticated-orcid":false,"given":"Lalit Kumar","family":"Baghel","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, IIT Ropar, Punjab, Ropar, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1586-5472","authenticated-orcid":false,"given":"Sukriti","family":"Gautam","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, IIT Ropar, Punjab, Ropar, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3696-7232","authenticated-orcid":false,"given":"Vikas Kumar","family":"Malav","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, IIT Ropar, Punjab, Ropar, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3929-7107","authenticated-orcid":false,"given":"Suman","family":"Kumar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, IIT Ropar, Punjab, Ropar, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3078166"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SoutheastCon45413.2021.9401906"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3079931"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IAC.2016.7905749"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2984549"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2021.3084996"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3081772"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3078892"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TBDATA.2020.2972564"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TGCN.2021.3062470"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3069894"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2951345"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2929212"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2257731"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2524532"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2940272"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/SAHCN.2006.288442"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/938985.938995"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VETEC.1997.600463"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2019.2911558"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2005.861207"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2017.2652320"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2009.2029191"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-374353-4.00008-9"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.35940\/ijrte.C4413.099320"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IOTAIS.2018.8600828"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/1609612"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/s21041102"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09774415.pdf?arnumber=9774415","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:47:06Z","timestamp":1705963626000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9774415\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3175059","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}