{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T16:32:19Z","timestamp":1775579539224,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3177716","type":"journal-article","created":{"date-parts":[[2022,5,25]],"date-time":"2022-05-25T19:33:44Z","timestamp":1653507224000},"page":"1-12","source":"Crossref","is-referenced-by-count":10,"title":["Error of Thermocouple in Measuring Surface Temperature of Blade With Cooling Film"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8016-968X","authenticated-orcid":false,"given":"Jie","family":"Ji","sequence":"first","affiliation":[{"name":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2600-163X","authenticated-orcid":false,"given":"Bing","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4105-9936","authenticated-orcid":false,"given":"Botao","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8509-1049","authenticated-orcid":false,"given":"Ming","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.expthermflusci.2005.05.004"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.expthermflusci.2009.10.008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatmasstransfer.2013.05.072"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatmasstransfer.2019.07.048"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatmasstransfer.2009.12.053"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2014.12.697"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3015383"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2514\/6.2019-4084"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/01430750.2020.1731709"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/ie50526a047"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.expthermflusci.2019.110017"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109868"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.4271\/2018-01-1765"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.106863"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1243\/JMES_JOUR_1968_010_048_02"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2017.8234067"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s11018-005-0048-6"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.12.070"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1115\/GT2013-94185"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.02.054"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1115\/1.4000541"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1115\/GT2014-25595"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1115\/1.2928279"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.4801853"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.2514\/6.2020-3283"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1155\/S1023621X01000033"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatmasstransfer.2017.11.034"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatmasstransfer.2013.11.033"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/AO.33.001950"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1063\/1.1384448"},{"key":"ref31","volume-title":"Transport Phenomena","author":"Bird","year":"2007"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09781378.pdf?arnumber=9781378","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:59:25Z","timestamp":1705964365000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9781378\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3177716","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}