{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,8]],"date-time":"2026-05-08T13:32:26Z","timestamp":1778247146630,"version":"3.51.4"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3177725","type":"journal-article","created":{"date-parts":[[2022,5,25]],"date-time":"2022-05-25T19:33:44Z","timestamp":1653507224000},"page":"1-10","source":"Crossref","is-referenced-by-count":13,"title":["Haze Elimination Model-Based Color Saturation Adjustment With Contrast Correction"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9961-5002","authenticated-orcid":false,"given":"Reman","family":"Kumar","sequence":"first","affiliation":[{"name":"Department of Electronics and Communication Engineering, National Institute of Technology Patna, Patna, Bihar, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9842-8125","authenticated-orcid":false,"given":"Ashish Kumar","family":"Bhandari","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication Engineering, National Institute of Technology Patna, Patna, Bihar, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6386-4530","authenticated-orcid":false,"given":"Manish","family":"Kumar","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication Engineering, National Institute of Technology Patna, Patna, Bihar, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3047190"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3026803"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3102739"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3052575"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/1.3115362"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2089110"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2976279"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2016.2527338"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2014.2372392"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2020.2991437"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksuci.2019.05.010"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2599103"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2665975"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2019.2930028"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2021.3098763"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2016371"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2009.2034873"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2015.2401732"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2226047"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2021.168251"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2019.02.058"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.image.2019.02.004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024335"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2010.168"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2639450"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2474701"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.2974060"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3096266"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.355"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2019.2910412"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.244"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3051462"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2003.1201821"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2008.4587643"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1117\/1.3267105"},{"key":"ref36","first-page":"106","article-title":"Color image database TID2013: Peculiarities and preliminary results","volume-title":"Proc. Eur. Workshop Vis. Inf. Process. (EUVIP)","author":"Ponomarenko"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1049\/el:20080522"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2014.2346028"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2293423"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2012.2227726"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/NCC.2015.7084843"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2214050"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2003.1261234"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09782076.pdf?arnumber=9782076","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:35:23Z","timestamp":1705962923000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9782076\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3177725","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}