{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T11:30:20Z","timestamp":1763724620566,"version":"3.37.3"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075353","52005303"],"award-info":[{"award-number":["52075353","52005303"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3178488","type":"journal-article","created":{"date-parts":[[2022,6,2]],"date-time":"2022-06-02T19:30:48Z","timestamp":1654198248000},"page":"1-14","source":"Crossref","is-referenced-by-count":25,"title":["Partial Domain Adaptation Method Based on Class-Weighted Alignment for Fault Diagnosis of Rotating Machinery"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4641-421X","authenticated-orcid":false,"given":"Xiao","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Rail Transportation, Soochow University, Suzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8690-0672","authenticated-orcid":false,"given":"Jinrui","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8207-1045","authenticated-orcid":false,"given":"Sixiang","family":"Jia","sequence":"additional","affiliation":[{"name":"School of Aeronautics, Northwestern Polytechnical University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7367-6253","authenticated-orcid":false,"given":"Baokun","family":"Han","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2022-2116","authenticated-orcid":false,"given":"Zongzhen","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TIE.2021.3050382"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.neucom.2020.09.022"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.ymssp.2019.106587"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.measurement.2021.109197"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.knosys.2021.107374"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TIM.2021.3111977"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1016\/j.inffus.2021.03.008"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1088\/1361-6501\/ac03e5"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.cja.2020.07.019"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1016\/j.ymssp.2018.02.016"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.ymssp.2018.12.051"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.knosys.2021.107142"},{"key":"ref13","first-page":"608","article-title":"Mapping and revising Markov logic networks for transfer learning","volume-title":"Proc. AAAI","volume":"7","author":"Mihalkova"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TPAMI.2020.2964173"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.knosys.2020.106236"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.neucom.2020.02.049"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.ymssp.2020.107095"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.isatra.2021.03.002"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.knosys.2021.106974"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/TIM.2021.3122742"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.3390\/e23040424"},{"key":"ref22","first-page":"2208","article-title":"Deep transfer learning with joint adaptation networks","volume-title":"Proc. 34th Int. Conf. Mach. Learn.","volume":"70","author":"Long"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TIM.2021.3120790"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/TIE.2021.3076704"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1016\/j.compind.2021.103399"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/TIE.2020.2984968"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1007\/978-3-030-01237-3_9"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.neunet.2020.06.014"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1016\/j.ymssp.2021.107618"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/TII.2020.3045002"},{"key":"ref31","first-page":"3320","article-title":"How transferable are features in deep neural networks?","volume-title":"Proc. 28th Conf. Neural Inf. Process. Syst. (NIPS)","volume":"27","author":"Yosinski"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/CVPR.2018.00288"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/TIM.2021.3055786"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/TIM.2021.3112800"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/72.991427"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/CVPR.2018.00851"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1109\/TII.2020.2994621"},{"key":"ref38","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"van der Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09787391.pdf?arnumber=9787391","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:48:51Z","timestamp":1706755731000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9787391\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3178488","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}