{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,28]],"date-time":"2026-04-28T15:30:36Z","timestamp":1777390236830,"version":"3.51.4"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61701085"],"award-info":[{"award-number":["61701085"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004829","name":"Department of Science and Technology of Sichuan Province","doi-asserted-by":"publisher","award":["2019JDZH0020"],"award-info":[{"award-number":["2019JDZH0020"]}],"id":[{"id":"10.13039\/501100004829","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010651","name":"Key Laboratory of Nondestructive Testing of Fujian Polytechnic Normal University","doi-asserted-by":"publisher","award":["S2-KF2013"],"award-info":[{"award-number":["S2-KF2013"]}],"id":[{"id":"10.13039\/501100010651","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3178493","type":"journal-article","created":{"date-parts":[[2022,5,27]],"date-time":"2022-05-27T20:56:48Z","timestamp":1653685008000},"page":"1-11","source":"Crossref","is-referenced-by-count":8,"title":["<i>RLC<\/i> Parameters Measurement and Fusion for High-Sensitivity Inductive Sensors"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3133-8309","authenticated-orcid":false,"given":"Dong","family":"Liu","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4766-4221","authenticated-orcid":false,"given":"Hong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Non-Destructive Testing Technology, Fujian Polytechnic Normal University, Fuzhou, Fujian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8400-648X","authenticated-orcid":false,"given":"Xiaoting","family":"Xiao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Information, Southwest Petroleum University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2172-7420","authenticated-orcid":false,"given":"Qiuping","family":"Ma","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2453-1995","authenticated-orcid":false,"given":"Haoran","family":"Li","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7563-1523","authenticated-orcid":false,"given":"Guiyun","family":"Tian","sequence":"additional","affiliation":[{"name":"School of Engineering, Newcastle University, Newcastle upon Tyne, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3377-6895","authenticated-orcid":false,"given":"Bin","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4732-6732","authenticated-orcid":false,"given":"Jianbo","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Engineering, Sichuan University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2843319"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2687138"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2017195"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.102202"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"16","DOI":"10.1016\/j.ndteint.2012.02.001","article-title":"A new eddy current displacement measuring instrument independent of sample electromagnetic properties","volume":"48","author":"Yu","year":"2012","journal-title":"NDT & E Int."},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3105255"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2950583"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3084204"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2014.04.009"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3038015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2659818"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11665-019-04062-7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0953-2048\/10\/8\/012"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2960620"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2018.03.037"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaae97"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2215141"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/el.2014.0558"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.1656680"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/el.2016.0919"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(97)80071-4"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(02)00008-7"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(98)00085-5"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2012.2323"},{"key":"ref25","volume-title":"A method for measuring equivalent parameters of piezoelectric crystal, inductor or capacitor","author":"Liu","year":"2020"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/el.2016.4320"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/mi12091086"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2952782"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2012.10.016"},{"key":"ref30","volume-title":"Quartz Crystal Resonators and Oscillators for Frequency Control and Timing Applications\u2014A Tutorial","author":"Vig","year":"2000"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09783052.pdf?arnumber=9783052","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:06:12Z","timestamp":1706753172000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9783052\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3178493","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}