{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T21:43:35Z","timestamp":1768340615145,"version":"3.49.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000190","name":"U.S. Department of Commerce","doi-asserted-by":"publisher","award":["BS123456"],"award-info":[{"award-number":["BS123456"]}],"id":[{"id":"10.13039\/100000190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3181900","type":"journal-article","created":{"date-parts":[[2022,6,10]],"date-time":"2022-06-10T20:20:29Z","timestamp":1654892429000},"page":"1-12","source":"Crossref","is-referenced-by-count":12,"title":["A Multivariate Temperature Drift Modeling and Compensation Method for Large-Diameter High-Precision Fiber Optic Gyroscopes"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3404-8227","authenticated-orcid":false,"given":"Xiaoxi","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8421-2307","authenticated-orcid":false,"given":"Gang","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4226-3752","authenticated-orcid":false,"given":"Hao","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0692-547X","authenticated-orcid":false,"given":"Lei","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1364\/ao.50.00e152"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.816154"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/opn.9.5.000028"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/ao.19.000654"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/50.17765"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1117\/12.210771"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.893253"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2012.02.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.1997.641482"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.08.032"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/ao.55.001061"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1023\/b:stco.0000035301.49549.88"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1998.0193"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2007.05.006"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.05.013"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/ao.55.006243"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/ao.57.008443"},{"key":"ref19","article-title":"Research on technologies of error processing of fog and initial alignment","author":"Wang","year":"2019"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.1998.86153"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2288675"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.02.020"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2016.02.011"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICNN.1995.488968"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09794420.pdf?arnumber=9794420","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:42:38Z","timestamp":1706755358000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9794420\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3181900","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}