{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T08:27:08Z","timestamp":1780475228184,"version":"3.54.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3183657","type":"journal-article","created":{"date-parts":[[2022,6,16]],"date-time":"2022-06-16T19:30:13Z","timestamp":1655407813000},"page":"1-9","source":"Crossref","is-referenced-by-count":25,"title":["Statistical Process Monitoring Based on Collaboration Preserving Embedding"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2494-1000","authenticated-orcid":false,"given":"Ruixiang","family":"Deng","sequence":"first","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5206-5186","authenticated-orcid":false,"given":"Yunpeng","family":"Fan","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1614-9910","authenticated-orcid":false,"given":"Zhiming","family":"Fang","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6063-0782","authenticated-orcid":false,"given":"Zhenbang","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2016.09.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/cem.800"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/ie302069q"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3075017"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b02391"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2864703"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.10.030"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690421011"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/ie1025387"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2669947"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(95)00076-3"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.05.002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301761"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2004.05.001"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1126\/science.290.5500.2323"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.7551\/mitpress\/1120.003.0080"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1126\/science.290.5500.2319"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2005.167"},{"key":"ref20","article-title":"Locality preserving projections","volume-title":"17th Annu. Conf. Neural Inf. Process. Syst. (NIPS)","author":"He"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2016.03.001"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2015.11.004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1021\/ie102564d"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2014.09.015"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b03077"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1021\/ie400854f"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.10.009"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1967.1053964"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/s0169-7439(99)00061-1"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/s0169-7439(00)00062-9"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/0959-1524(96)00010-8"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/s0967-0661(99)00191-4"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.02.027"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2003.09.004"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2019.05.010"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref38","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-0347-9","volume-title":"Fault Detection and Diagnosis in Industrial Systems","author":"Chiang","year":"2001"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1021\/ie049624u"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09797741.pdf?arnumber=9797741","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T04:18:28Z","timestamp":1706761108000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9797741\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3183657","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}