{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T16:23:19Z","timestamp":1779294199100,"version":"3.51.4"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2019YFB2004900"],"award-info":[{"award-number":["2019YFB2004900"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075143"],"award-info":[{"award-number":["52075143"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52175506"],"award-info":[{"award-number":["52175506"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3183678","type":"journal-article","created":{"date-parts":[[2022,6,16]],"date-time":"2022-06-16T19:30:13Z","timestamp":1655407813000},"page":"1-10","source":"Crossref","is-referenced-by-count":17,"title":["Novel Compensation Method of Volumetric Errors for Micro-Coordinate Measuring Machines Using Abbe and Bryan Principles"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1763-2744","authenticated-orcid":false,"given":"Ya-Xiong","family":"He","sequence":"first","affiliation":[{"name":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3743-6567","authenticated-orcid":false,"given":"Rui-Jun","family":"Li","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1951-4485","authenticated-orcid":false,"given":"Jie","family":"Li","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7570-9482","authenticated-orcid":false,"given":"Wen-Kai","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0043-5528","authenticated-orcid":false,"given":"Zhen-Ying","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0965-5110","authenticated-orcid":false,"given":"Qiang-Xian","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1320-9412","authenticated-orcid":false,"given":"Kuang-Chao","family":"Fan","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Dalian University of Technology, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/23\/7\/074001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/c2012-0-06010-3"},{"key":"ref3","first-page":"10","article-title":"Development of nano-CMM and parallel-CMM\u2013CMM in the 21st century","volume-title":"Proc. Int. Dimensional Metrol. Workshop","author":"Takamasu"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1201\/b11022"},{"key":"ref5","first-page":"18","volume-title":"Coordinate Measuring Machines","author":"Zhang","year":"1999"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-001-0156-4"},{"key":"ref7","first-page":"725","article-title":"Development of high precision coordinate measuring machine (CMM) (1st report, evaluation method of XY stage)","author":"Yang","year":"2009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.04.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1524\/teme.2009.0960"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/app6090257"},{"key":"ref11","first-page":"15","article-title":"ISARA 400: Development of an ultra-precision CMM for 3D measurement of large parts","volume":"45","author":"Spaan","year":"2009","journal-title":"Proc. Spring Top. Meet. Mech. Metrol. Meas. Uncertainty (ASPE)"},{"key":"ref12","first-page":"81","article-title":"ISARA 400: Enabling ultra-precision coordinate metrology for large parts","volume-title":"Proc. ASPE 2010 Annu. Meet.","volume":"50","author":"Donker"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/8\/085904"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/s0007-8506(07)62871-6"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2011.01.004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/app6040097"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/s0007-8506(07)63216-8"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1117\/12.904072"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/app6030086"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2015.08.001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2020.103527"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/oe.26.017185"},{"key":"ref23","first-page":"446","article-title":"Messapparate f\u00fcr physiker [measuring instruments for physicists]. Zeitschrift fur instrumentenkunde","volume-title":"J. Sci. Instrum.","volume":"10","author":"Abb\u00e9","year":"1890"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/0141-6359(79)90037-0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.18494\/sam.2015.1131"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s16101610"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/s16101705"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3117372"},{"issue":"2","key":"ref29","first-page":"107","article-title":"Measurement of pre-travel distance of a touch probe for nano-CMM","volume":"8","author":"Cheng","year":"2010","journal-title":"Nanotechnol. Precis. Eng."}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09797779.pdf?arnumber=9797779","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T05:03:54Z","timestamp":1706763834000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9797779\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3183678","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}