{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:37:39Z","timestamp":1777657059670,"version":"3.51.4"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100017596","name":"Natural Science Basic Research Program of Shaanxi","doi-asserted-by":"publisher","award":["2020JQ-491"],"award-info":[{"award-number":["2020JQ-491"]}],"id":[{"id":"10.13039\/501100017596","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Young Elite Scientists Sponsorship Program by University Association for Science and Technology of Shaanxi","award":["20200109"],"award-info":[{"award-number":["20200109"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3186045","type":"journal-article","created":{"date-parts":[[2022,11,4]],"date-time":"2022-11-04T20:33:55Z","timestamp":1667594035000},"page":"1-11","source":"Crossref","is-referenced-by-count":27,"title":["A New Adaptive Interpretable Fault Diagnosis Model for Complex System Based on Belief Rule Base"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9269-5601","authenticated-orcid":false,"given":"Can","family":"Li","sequence":"first","affiliation":[{"name":"Xi’an Research Institute of High-Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5907-0893","authenticated-orcid":false,"given":"Qiang","family":"Shen","sequence":"additional","affiliation":[{"name":"Xi’an Research Institute of High-Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7656-8012","authenticated-orcid":false,"given":"Lixin","family":"Wang","sequence":"additional","affiliation":[{"name":"Xi’an Research Institute of High-Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6479-336X","authenticated-orcid":false,"given":"Weiwei","family":"Qin","sequence":"additional","affiliation":[{"name":"Xi’an Research Institute of High-Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8256-2354","authenticated-orcid":false,"given":"Meimei","family":"Xie","sequence":"additional","affiliation":[{"name":"Xi’an Research Institute of High-Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2008.10.052"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2020.105869"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssci.2016.11.011"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2014.09.006"},{"key":"ref34","first-page":"1297","article-title":"Structure learning for belief rule base using principal component analysis","volume":"34","author":"chang","year":"2014","journal-title":"Systems Engineering - Theory & Practice"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2006.873524"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/41.807988"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847961"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2005.07.015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(90)90018-D"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/9.508919"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2017.08.468"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"92","DOI":"10.1109\/61.847234","article-title":"A fault diagnosis expert system for distribution substations","volume":"15","author":"lee","year":"2000","journal-title":"IEEE Trans Power Del"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3016045"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/41.873214"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2005.11.015"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847115"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2020.1003399"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2014.2362015"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3051948"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-008-0327-0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3085940"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108105"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3138834"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3055786"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2243743"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2965635"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2007.897606"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa966e"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.03.032"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2010.10.018"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2008.09.032"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2013.01.022"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2011.10.044"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09940153.pdf?arnumber=9940153","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:15:37Z","timestamp":1670872537000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9940153\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3186045","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}