{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T06:36:06Z","timestamp":1759991766978,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52077023"],"award-info":[{"award-number":["52077023"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of Chongqing","doi-asserted-by":"publisher","award":["cstc2020jcyj-msxmX0340"],"award-info":[{"award-number":["cstc2020jcyj-msxmX0340"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010877","name":"Shenzhen Science and Technology Innovation Commission","doi-asserted-by":"publisher","award":["CJGJZD20200617102402006"],"award-info":[{"award-number":["CJGJZD20200617102402006"]}],"id":[{"id":"10.13039\/501100010877","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3186076","type":"journal-article","created":{"date-parts":[[2022,6,24]],"date-time":"2022-06-24T19:33:49Z","timestamp":1656099229000},"page":"1-16","source":"Crossref","is-referenced-by-count":7,"title":["Semi-Contactless Power Measurement Method for Single-Phase Enclosed Two-Wire Residential Entrance Lines"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8614-830X","authenticated-orcid":false,"given":"Xiaohu","family":"Liu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8306-0572","authenticated-orcid":false,"given":"Wei","family":"He","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6498-4414","authenticated-orcid":false,"given":"Pan","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Physics and Electronic Engineering, Chongqing Normal University, Chongqing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6945-7848","authenticated-orcid":false,"given":"Yuhang","family":"Yang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5552-865X","authenticated-orcid":false,"given":"Taoning","family":"Guo","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3968-414X","authenticated-orcid":false,"given":"Zheng","family":"Xu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"Global Warming of 1.5 \u00b0C","year":"2022","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/5.192069"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2821650.2821672"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2013.2284760"},{"volume-title":"TED Spyder 60 Individual Circuit Monitoring Tool for Pro Series, 60A","year":"2022","key":"ref5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2266089"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2652344"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2359619"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2907734"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3012839"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2849510"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3111982"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2419032"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2813540"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2711898"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2619666"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2002.801428"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2924571"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2360804"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3044757"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2958521"},{"volume-title":"AD8220ARMZ Analog Devices |Mouser","year":"2022","key":"ref22"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1993.382674"},{"key":"ref24","first-page":"726","article-title":"Quasi-synchronous sampling algorithm and its applications\u2014Part 3: High accurate measurement of frequency deviation and phase angle difference in power systems","volume-title":"Proc. IEEE IMTC","volume":"93","author":"Dai"},{"volume-title":"Evaluation of Measurement Data Guide to the Expression of Uncertainty in Measurement","year":"2022","key":"ref25"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/19.963199"},{"volume-title":"VICTOR VC980+ Digital Multimeter 19999 Counts Intelligent Protection Large Capacitance and Resistance True RMS Backlight Tester_Double King Industrial Holdings","year":"2022","key":"ref27"},{"volume-title":"TMR2102\u2014Magnetic Field Sensors\u2014Sensors\u2014Multi-Dimension Technology, The Leading Supplier of TMR Magnetic Sensors\u2014Multi-Dimension Technology","year":"2022","key":"ref28"},{"volume-title":"YUANXING ELECTRONICs High Precision CT\/VT","year":"2022","key":"ref29"},{"volume-title":"C Series Voltage Input Module\u2014NI","year":"2022","key":"ref30"},{"volume-title":"PT\u2013710 (100 KHZ,0.2\u2013100A) AC\/DC Current Probe-Current Probe-PINTECH Oscilloscope\/Differential Probe\/Current Probe\/High Voltage Amplifier\/Power Supply","year":"2021","key":"ref31"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-83724-1_12"},{"volume-title":"Knitro: An Integrated Package for Nonlinear Optimization: Large-Scale Nonlinear Optimization","year":"2006","author":"Byrd","key":"ref33"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2562318"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09806436.pdf?arnumber=9806436","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T04:18:40Z","timestamp":1706761120000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806436\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3186076","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}