{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T18:41:18Z","timestamp":1780512078766,"version":"3.54.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51976189"],"award-info":[{"award-number":["51976189"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004731","name":"Natural Science Foundation of Zhejiang Province","doi-asserted-by":"publisher","award":["LQ22F030001"],"award-info":[{"award-number":["LQ22F030001"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["226-2022-00086"],"award-info":[{"award-number":["226-2022-00086"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3187713","type":"journal-article","created":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T19:27:09Z","timestamp":1656703629000},"page":"1-18","source":"Crossref","is-referenced-by-count":14,"title":["Study on Dual-Frequency Imaging of Capacitively Coupled Electrical Impedance Tomography: Frequency Optimization"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1677-4671","authenticated-orcid":false,"given":"Yandan","family":"Jiang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0688-2385","authenticated-orcid":false,"given":"Junchao","family":"Huang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3676-4817","authenticated-orcid":false,"given":"Haifeng","family":"Ji","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0045-0576","authenticated-orcid":false,"given":"Baoliang","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1858-5994","authenticated-orcid":false,"given":"Zhiyao","family":"Huang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6341-9592","authenticated-orcid":false,"given":"Manuchehr","family":"Soleimani","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, Engineering Tomography Laboratory (ETL), University of Bath, Bath, U.K."}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Electrical Impedance Tomography: Methods, History and Applications","author":"Holder","year":"2005"},{"key":"ref2","volume-title":"Industrial Tomography: Systems and Applications","author":"Wang","year":"2015"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2014.12.103"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/18\/6\/201"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/12\/8\/301"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2017.12.017"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/25\/5\/055110"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/7\/074002"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/28\/7\/S15"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2008.920600"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2246912"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2012.10.009"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0021-9673(80)80001-X"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.trac.2018.03.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.01.032"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1108\/SR-03-2014-626"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/27\/2\/025405"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab1324"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3056739"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s20205787"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aadb1c"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/0471716243"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3045842"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2687828"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2755981"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2874569"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1063\/1.4999359"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2013.2284966"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/BF02478601"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1097\/00004669-197807000-00019"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.11113\/jt.v73.4408"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2895035"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2980112"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/25\/1\/021"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1108\/03321641211209753"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2878583"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1108\/SR-01-2016-0027"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11216-4"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09812719.pdf?arnumber=9812719","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T05:03:51Z","timestamp":1706763831000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9812719\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3187713","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}