{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:58:18Z","timestamp":1777658298201,"version":"3.51.4"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51975355"],"award-info":[{"award-number":["51975355"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3193196","type":"journal-article","created":{"date-parts":[[2022,7,21]],"date-time":"2022-07-21T19:26:42Z","timestamp":1658431602000},"page":"1-12","source":"Crossref","is-referenced-by-count":12,"title":["Integration of a Novel Knowledge-Guided Loss Function With an Architecturally Explainable Network for Machine Degradation Modeling"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3757-0889","authenticated-orcid":false,"given":"Tongtong","family":"Yan","sequence":"first","affiliation":[{"name":"State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6094-616X","authenticated-orcid":false,"given":"Yichu","family":"Fu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4024-4555","authenticated-orcid":false,"given":"Ming","family":"Lu","sequence":"additional","affiliation":[{"name":"Infrastructure and Cloud Services, SSG-IT, Lenovo, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6565-254X","authenticated-orcid":false,"given":"Zhinong","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nangchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5143-8366","authenticated-orcid":false,"given":"Changqing","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Rail Transportation, Soochow University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4872-4860","authenticated-orcid":false,"given":"Dong","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.02.046"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.37965\/jdmd.v2i2.47"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.37965\/jdmd.2022.65"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2978966"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2018.2890608"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11265-019-01491-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/machines9100238"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/s22041590"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2014.08.006"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2018.06.038"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2691730"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-018-2874-0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2020.12.052"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2017.8079167"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108573"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.11.008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.05.015"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3057498"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3098737"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac3855"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108868"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2020.3048950"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/s21124070"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2017.04.009"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2898634"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050382"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.artint.2022.103667"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108673"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2010.07.018"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.4108\/eai.27-2-2020.2303168"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2005.03.007"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2005.12.126"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2994741"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09837105.pdf?arnumber=9837105","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T03:18:58Z","timestamp":1709349538000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9837105\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3193196","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}