{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,13]],"date-time":"2026-06-13T02:36:47Z","timestamp":1781318207773,"version":"3.54.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51937009"],"award-info":[{"award-number":["51937009"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51877166"],"award-info":[{"award-number":["51877166"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Natural Science Foundation of Ningxia Hui Autonomous Region","award":["2021AAC03501"],"award-info":[{"award-number":["2021AAC03501"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3193710","type":"journal-article","created":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T19:46:20Z","timestamp":1658778380000},"page":"1-11","source":"Crossref","is-referenced-by-count":15,"title":["A New Measurement Method of Contact Conditions in a Vacuum Circuit Breaker With the Field Emission Current During the Closing Operation"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0528-8176","authenticated-orcid":false,"given":"Yun","family":"Geng","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7800-6750","authenticated-orcid":false,"given":"Jinlong","family":"Dong","sequence":"additional","affiliation":[{"name":"Institute of Biomedical Engineering and Informatics, Technische Universität Ilmenau, Ilmenau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5392-6101","authenticated-orcid":false,"given":"Xiaofei","family":"Yao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4805-3094","authenticated-orcid":false,"given":"Jiangang","family":"Ding","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5206-9996","authenticated-orcid":false,"given":"Chen","family":"Guan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7040-5471","authenticated-orcid":false,"given":"Yingsan","family":"Geng","sequence":"additional","affiliation":[{"name":"Institute of Biomedical Engineering and Informatics, Technische Universität Ilmenau, Ilmenau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4943-6572","authenticated-orcid":false,"given":"Zhiyuan","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2978599"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2597302"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3011734"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2913061"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3045798"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2938077"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/94.993739"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2880939"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3069364"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12383"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2018.2854715"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1970.4313858"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/6144.774755"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DEIV.2014.6961705"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2016.2640341"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.vacuum.2017.06.002"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.004017"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2021.107692"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/en13123217"},{"key":"ref20","volume-title":"The Vacuum Interrupter Theory, Design and Application","author":"Slade","year":"2008"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006482"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0016-0032(66)90043-3"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106860"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEI.1987.298968"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.5931080"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/eej.1060"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2006.1593402"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tps.2022.3175358"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005258"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/61.400850"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/HOLM.2006.284061"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09839416.pdf?arnumber=9839416","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T01:58:40Z","timestamp":1710381520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9839416\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3193710","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}