{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T19:01:14Z","timestamp":1772823674126,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["6207020955"],"award-info":[{"award-number":["6207020955"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific Research Project of Hunan Provincial Department of Education","award":["19C1262"],"award-info":[{"award-number":["19C1262"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3196738","type":"journal-article","created":{"date-parts":[[2022,8,5]],"date-time":"2022-08-05T19:25:54Z","timestamp":1659727554000},"page":"1-13","source":"Crossref","is-referenced-by-count":22,"title":["A Practical Micro Fringe Projection Profilometry for 3-D Automated Optical Inspection"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6029-2111","authenticated-orcid":false,"given":"Tianle","family":"Cheng","sequence":"first","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7702-7151","authenticated-orcid":false,"given":"Xuewen","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4668-5362","authenticated-orcid":false,"given":"Long","family":"Qin","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1494-673X","authenticated-orcid":false,"given":"Minghao","family":"Lu","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4864-5444","authenticated-orcid":false,"given":"Changyan","family":"Xiao","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0585-9848","authenticated-orcid":false,"given":"Shutao","family":"Li","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/WCICA.2008.4592931"},{"key":"ref2","volume-title":"Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing Interferometry","volume":"100","author":"Steinchen","year":"2003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2012.02.002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.matchar.2014.11.033"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.04.019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106192"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.wear.2005.09.036"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.006846"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.031826"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/AO.54.010055"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.05.021"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.031492"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.001222"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2014.01.021"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1667239.1667247"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/AO.33.004497"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.53.10.102105"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.14358\/PERS.81.2.103"},{"issue":"8","key":"ref19","first-page":"855","article-title":"Close-range camera calibration","volume":"37","author":"Duane","year":"1971","journal-title":"Photogramm. Eng."},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/34.888718"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.5772\/51699"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09851462.pdf?arnumber=9851462","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T11:17:20Z","timestamp":1706786240000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9851462\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3196738","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}