{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:23Z","timestamp":1740132563543,"version":"3.37.3"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["1940992"],"award-info":[{"award-number":["1940992"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3199256","type":"journal-article","created":{"date-parts":[[2022,9,14]],"date-time":"2022-09-14T19:30:30Z","timestamp":1663183830000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Variable Exposure Portable Perfusion Monitor Using Commercial Vision Processing System-on-Modules (SOMs)"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8799-6346","authenticated-orcid":false,"given":"Aditya","family":"Pandya","sequence":"first","affiliation":[{"name":"Department of Mechanical Engineering, University of California at Riverside, Riverside, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2018-8552","authenticated-orcid":false,"given":"Natanael","family":"Cuando-Espitia","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, University of California at Riverside, Riverside, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4437-0516","authenticated-orcid":false,"given":"David L.","family":"Halaney","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, University of California at Riverside, Riverside, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7326-1162","authenticated-orcid":false,"given":"Guillermo","family":"Aguilar","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, University of California at Riverside, Riverside, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/1.jbo.24.8.080901"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/17434440.2019.1644166"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/micr.30320"},{"volume-title":"Plastic Surgery Statistics Report","year":"2019","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1097\/01.sap.0000262740.34106.1b"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1097\/gox.0000000000001651"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/704206"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1001\/jamasurg.2018.1687"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/1.3149863"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1117\/1.jbo.21.9.094001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/boe.10.005149"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.3505118"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EMBC.2019.8857273"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/jbio.201700069"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1117\/1.jbo.24.1.016001"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/1.jbo.25.11.116007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1117\/1.jbo.20.8.086009"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3076799"},{"volume-title":"Vision Programming Interface\u2014NVIDIA","year":"2021","key":"ref19"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1962.10490022"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/19\/9717300\/9889786-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09889786.pdf?arnumber=9889786","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:10:32Z","timestamp":1705957832000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9889786\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3199256","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}