{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,1,17]],"date-time":"2023-01-17T06:01:19Z","timestamp":1673935279851},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3200280","type":"journal-article","created":{"date-parts":[[2022,9,13]],"date-time":"2022-09-13T19:37:11Z","timestamp":1663097831000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["I\u00b2MTC 2021 Special Issue in IEEE Transactions on Instrumentation and Measurement"],"prefix":"10.1109","volume":"71","author":[{"given":"Pawel","family":"Niewczas","sequence":"first","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kristen M.","family":"Donnell","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Missouri University of Science and Technology, St. Rolla, MO, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Melanie","family":"Ooi","sequence":"additional","affiliation":[{"name":"School of Engineering, University of Waikato, Hamilton, New Zealand"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09888256.pdf?arnumber=9888256","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,16]],"date-time":"2023-01-16T19:05:43Z","timestamp":1673895943000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9888256\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3200280","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}